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Abstract: The application of X-ray Diffraction Imaging to measure in operando thermal strains at individually powered components within fully packaged LM3046 silicon devices is described. It is shown that as the local strains increase with power dissipated, above a threshold power loading, the associated region of enhanced X-ray intensity increases monotonically. The changes in contrast in the image are discussed. Asterism in section topographs changes sign as the slit is moved across the component, consistent with lattice strain around the device due to the thermal expansion. Above a threshold power, this asterism increases linearly with power loading. By simultaneous measurement of the package surface temperature it is possible to deduce the local component temperature from the extent of the contrast in the X-ray image.

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Abstract: Friction stir welding (FSW) since its invention has been attracting relevant interest for joining aluminium alloys. Due to the nature of this process, the materials can be joint without melting. Thanks to this peculiar characteristic, the issues associated with the cooling from liquid phase are avoided or considerably reduced, such as cracking, porosity, and defects. However, as well as other well‐established welding techniques, the FSW process gives rise to formation of residual stress in the welding region and surrounding volume: heat and thermo‐mechanical affected zones. Presence of residual stress in a mechanical component is well‐known to affect its performance, particularly regarding fatigue at high number of cycles. Another aspect that influences the fatigue life is the underlying microstructure. In this work, we firstly study the residual stress field and the underlying microstructural features arising in FSW butt joints and their effect on the fatigue performance of this type of weldments. The evaluation of residual stress field is carried out by means of modern experimental techniques. In the first instance, synchrotron X‐ray powder diffraction was employed for two‐dimensional full field maps of residual stress. Corroboration of these measurements was done by exploiting the capability of focused ion beam and digital image correlation (FIB‐DIC), which is able to deliver pointwise absolute measurement of residual stress. A set of FSW samples were then tested under uniaxial fatigue loading at several loading ranges, in the high cycle fatigue regime, in order to understand whether the severity of loads affects the crack path and life endurance. Fractographic and electron backscattered diffraction (EBSD) analysis then revealed crack nucleation site and propagation mechanisms with the respect of the underlying microstructure. Outcome of these experimental studies is then thoroughly discussed.

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Abstract: Our group employs micro- and nano-X-ray fluorescence spectrometry (XRF) for the investigation of bone tissue. The manuscript presents the results of 3 various projects, in which spatial distribution of trace elements in bone samples was studied. The first study investigated the distribution of the elemental constituents of Mg-based implants at various stages of the degradation process in surrounding bone tissue with a focus on magnesium (Mg) and yttrium (Y). The analysis was performed in laboratory of Atominstitut using a special micro-XRF spectrometer for light element detection. The second study is devoted to the spatial distribution of Zn in high-grade sclerosing osteosarcoma mapped by confocal synchrotron radiation induced micro-XRF. Tumour zinc levels were compared with adjacent normal tissue. For discrimination between healthy and diseased bone quantitative backscattered electron imaging was used. The third experiment demonstrates the performance of synchrotron radiation induced nano-XRF with beam size of about 500 nm for bone tissue investigation. Special emphasis is set to advantages of micro- and nano-XRF in bone analysis as well as overcoming possible limitations.

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Abstract: For the Phase-II Upgrade of the ATLAS detector at CERN, the current ATLAS Inner Detector will be replaced with the ATLAS Inner Tracker (ITk). The ITk will be an all-silicon detector, consisting of a pixel tracker and a strip tracker. Sensors for the ITk strip tracker are required to have a low leakage current up to bias voltages of −500 V to maintain a low noise and power dissipation. In order to minimise sensor leakage currents, particularly in the high-radiation environment inside the ATLAS detector, sensors are foreseen to be operated at low temperatures and to be manufactured from wafers with a high bulk resistivity of several kΩcm. Simulations showed the electric field inside sensors with high bulk resistivity to extend towards the sensor edge, which could lead to increased surface currents for narrow dicing edges. In order to map the electric field inside biased silicon sensors with high bulk resistivity, three diodes from ATLAS silicon strip sensor prototype wafers were studied with a monochromatic, micro-focused X-ray beam at the Diamond Light Source (Didcot, U.K.). For all devices under investigation, the electric field inside the diode was mapped and its dependence on the applied bias voltage was studied.

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Abstract: We present a combined experimental and numerical study that provides the understanding of deformation mechanisms and stresses in Mg AZ31B alloy across scales, from macro-scale (Type I) to micro- (inter-granular, Type II) and nano-scale (intra-granular, Type III). The combination of in situ synchrotron X-ray diffraction (XRD), in situ electron backscattered diffraction (EBSD) and crystal plasticity finite element (CPFE) modeling of crystal slip and twinning/detwinning was employed. The crystal rotation observed directly in the XRD and EBSD experiments revealed the onset and completion of the twinning/detwinning processes during in situ cyclic compression-tension loading. It also allowed reliable calibration of the key model parameters, in particular critical resolved shear stress (CRSS) of detwinning. The validation of the model was performed at distinct different scales corresponding to all stress types. Direct comparison with the data from the loading device provided the confirmation of the model validity in terms of correct description of the macroscopic stress-strain response (Type I stresses). The calibration led to the CRSS detwinning value of 23 MPa, and twinning of 46.5 MPa. At the inter-granular micro-scale (Type II stresses), the model satisfactorily predicted the transition between different plastic deformation modes (slip, twinning and detwinning), as confirmed by the comparison with peak intensities in XRD experiments. For the intra-granular (nano-scale) Type III stresses, it was concluded that the model was also valid at the level of statistical description (rather than local behavior). Namely, it has not been possible to predict correctly the real morphology of the twins observed in EBSD experiments.