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Abstract: The shape and strain field of a needle domain in a barium titanate single crystal are modelled using a distribution of dislocations and line charges. The arrangement of these dislocations and charges is a result of the balance of modified Peach-Koehler forces acting among the dislocations and a lattice friction assumed to act at each dislocation site. Based on measurements of needle shape by synchrotron X-ray diffraction, dislocation pile-up theory is used to compute the distribution of discrete dislocations along the needle and hence estimate the lattice friction. It is found that the lattice friction in this model is proportional to the opening angle of a wedge-shape needle domain and consistent with the observed magnitude of stress required to mobilize needle domains. The microstrain distribution around an a-a needle domain tip, obtained from X-ray diffraction measurement, is further used to test the dislocation model, with a similar pattern and magnitude of strains identified in the model and the experiment.

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Abstract: Dendrites are the most common microstructural features in the cast metals, significantly affecting the structure integrity and mechanical properties of the castings. In this study, the in situ synchrotron X-ray radiographic and tomographic imaging techniques were combined to evaluate the critical fracture stress of the growing dendrite tip during the solidification of an Al-15 wt% Cu alloy under an external electromagnetic force. Two dendritic 3D models have been proposed to simulate the dendrite 3D morphologic characteristics and thus revealed that the critical fracture stresses of the Al dendrites at temperatures close to its melting point were in the range of 0.5 kPa–0.05 MPa. The present results demonstrate the feasibility of measuring the high-temperature mechanical properties of the metallic dendrites.

Open Access

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Abstract: High-speed adaptive correction of optics, based on real-time metrology feedback, has benefitted numerous scientific communities for several decades. However, it remains a major technological challenge to extend this concept into the hard x ray regime due to the necessity for active mirrors with single-digit nanometer height errors relative to a range of aspheric forms. We have developed a high-resolution, real-time, closed-loop “adaptive” optical system for synchrotron and x ray free electron laser (XFEL) applications. After calibration of the wavefront using x ray speckle scanning, the wavefront diagnostic was removed from the x ray beam path. Non-invasive control of the size and shape of the reflected x ray beam was then demonstrated by driving a piezoelectric deformable bimorph mirror at ∼1Hz . Continuous feedback was provided by a 20 kHz direct measurement of the optical surface with picometer sensitivity using an array of interferometric sensors. This enabled a non-specialist operator to reproduce a series of pre-defined x ray wavefronts, including focused or non-Gaussian profiles, such as flattop intensity or multiple split peaks with controllable separation and relative amplitude. Such changes can be applied in any order and in rapid succession without the need for invasive wavefront diagnostic sensors that block the x ray beam for scientific usage. These innovations have the potential to profoundly change how x ray focusing elements are utilized at synchrotron radiation and XFEL sources and provide unprecedented dynamic control of photon beams to aid scientific discoveries in a wide range of disciplines.

Open Access

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Abstract: Halide perovskites recently emerged as promising materials for the detection of ionising radiation. Single crystals of halide perovskites exhibit very fast and bright scintillation when cooled and may outperform the best modern scintillators at temperatures below 100 K. In this work we report on low-temperature scintillation properties of CsPbCl3 single crystals, grown using the Bridgeman method. The temperature dependences of the luminescence and decay kinetics were studied using X-ray excitation. At low temperatures, the crystal exhibits an intense narrow-band emission at about 420 nm with very fast decay kinetics. This emission, of which a characteristic feature is the strong thermal quenching, is attributed to the radiative decays of bound and trapped excitons. The fast, middle, and slow decay time constants obtained from a fit of a sum of exponential functions to the decay curve at 10 K are 0.1, 1 and 11 ns, respectively. The scintillation light yield of CsPbCl3 at 7 K measured at excitation with α-particles from an 241Am source is estimated to be 140 ± 15% of a reference LYSO-Ce crystal and 19000 ± 2000 ph per MeV under 14 keV X-ray excitation at 10 K. It is concluded that owing to a reduced amplitude of the slow decay component, CsPbCl3 exhibits an ultra-fast scintillation response that is superior to that of other halide perovskites. The combination of sub-nanosecond response time and the encouraging light yield has the potential of establishing this material as first choice for scintillation applications that rely on prompt detector response at cryogenic temperatures.

Open Access

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Abstract: The development of semiconductor sensors for new particle tracking detectors places increasing limits on sensor characteristics such as uniformity, size and shape of inefficient areas and size of active compared to inactive sensor areas. Accurately assessing these relatively subtle effects requires either measurements in particle beams or the modification of samples to be used in dedicated laser test setups. Active Region Extent Assessment with X-rays (AREA-X) has been developed as an alternative method for the fast, efficient and precise study of the active area of a semiconductor sensor. It uses a monochromatic, micro-focused X-ray beam with a 10–20 keV energy range as provided by several synchrotron beam lines and uses the photo current induced in the sensor to measure the depth of the responsive sensor volume. It can be used to study local inhomogeneities or inefficiencies, the overall extent of the active sensor volume and its shape and its localised application, which makes the need to gather statistics over a large area unnecessary, allowing for fast readout, which enables studies of the sensor behaviour at a range of external parameters, e.g. temperature or applied bias voltage. This paper presents the measurement concept and technical setup of the measurement, results from initial measurements as well as capabilities and limitations of the method.