B16-Test Beamline
Optics
|
Open Access
Abstract: Advances in x-radiation sources put greater demands on x-ray optics. Fabrication errors in optical elements lead to deformation of the radiation wavefront, which prevents diffraction-limited imaging of the source. A new adaptable x-ray phase compensator using refracting elements has been developed, fabricated, and tested. The compensator makes a sinusoidal correction to the x-ray wavefront with variable amplitude, period, and phase. The adaptable compensator was used to correct two planar compound refractive lenses and a Kirkpatrick–Baez mirror system on an x-ray beamline. Wavefront measurements showed a reduction in the rms wavefront error by a factor of seven for the lenses and three for the mirror system, reducing rms wavefront errors down to of order
𝜆/100
λ/100
. This concept could be used with optics on existing x-ray beamlines to enable diffraction-limited focusing.
|
Dec 2019
|
|
B16-Test Beamline
Metrology
Optics
|
Diamond Proposal Number(s):
[19902]
Abstract: As an important characterization method for beamline optics, at-wavelength metrology technology based on wavefront measurements has been developed for many years. However, the previous studies on at-wavelength metrology of reflective mirrors is limited to the indirect method. So, the accurate surface information of the mirror under test would normally be inaccessible because of lack of experimental deconvolution between the mirror and any backgrounds from upstream optics. In this study, an absolute metrology method is developed based on the speckle scanning technique. Using this method, the surface profile of the mirror can be extracted exactly from the mixed information of the entire upstream beamline. At the same time, data acquisition time can also be significantly reduced by the processing algorithm introduced in this study without sacrificing the angular sensitivity.
|
Nov 2019
|
|
Metrology
Optics
|
Open Access
Abstract: We present recent advancements in the Optical Metrology Laboratory (OML) at Diamond Light Source. Improvements in optical manufacturing technology, and demands from beamlines at synchrotron and free electron laser facilities, have made it a necessity to routinely characterize X-ray mirrors with slope errors < 100 nrad rms. The Diamond-NOM profiler can measure large, fully assembled optical systems in a sideways, upwards, or downwards facing geometry. Examples are provided of how it has recently characterized several challenging systems, including: actively bent mirrors; clamped monochromator gratings in a downward-facing geometry; and four, state-of-the-art, elliptically bent, long mirrors with slope errors < 100 nrad rms. The NOM’s components and data analysis procedures are continuously updated to stay ahead of the ever-increasing quality of X-ray optics and opto-mechanics. The OML’s newest instrument is a Zygo HDX 6” Fizeau interferometer. A dedicated support frame and motorized translation and rotation stages enable sub-aperture images to be stitched together using in-house controls and automation software. Cross-comparison of metrology data, including as part of the MooNpics collaboration, provides a valuable insight into the nature of optical defects and helps to push optical fabrication to a new level of quality.
|
Sep 2019
|
|
Metrology
Optics
|
Open Access
Abstract: Meeting the ever-increasing performance demands of X-ray beamlines at modern synchrotrons, such as Diamond Light Source (DLS), requires the use of ultra-high-quality X-ray mirrors with surface deviations of less than a few nanometres from their ideal shape. Ion beam figuring (IBF) is frequently used for creating mirrors of this precision, but achieving the highest accuracy is critically dependent on careful alignment and precise metrology of defects on the optical surface. Multiple iterations of measurement and correction are typically required, and convergence towards the requisite shape can be a slow process. DLS have designed and built an in-house IBF system that comprises a large diameter DC gridded ion source, and a 4-axis motion stage for manipulating the mirror being figured. Additionally, a slope measuring profilometer for in-situ metrology, and an imaging system for alignment, are also built into the system. The advantages of incorporating these extra components are twofold: fast metrology feedback after each figuring run will considerably reduce the time required to perform multiple figuring iterations; and alignment and indexing errors will be drastically reduced when transferring the optic. Complemented by the Optical Metrology Laboratory at DLS and at-wavelength X-ray measurements on the Test beamline B16, it is expected that this system will enable rapid development and testing of high-quality mirrors with novel designs for micro- and nano-focussing of X-rays.
|
Sep 2019
|
|
Metrology
Optics
|
Open Access
Abstract: There is growing interest at synchrotron light and X-ray free electron laser facilities to explore and improve the dynamic performance of piezoelectric bimorph deformable X-ray mirrors. Many beamlines, especially those dedicated to Macromolecular Crystallography, need to measure hundreds of samples per day. Shorter acquisition time requires rapid changes in the focus of the X-ray beam to condense the maximum photon density onto the sample. This is necessary to match the X-ray beam to the dimensions of the sample, or to probe variable sized regions of larger samples. Fine control of the X-ray beam becomes crucial for ensuring the highest quality of scientific data and increased throughput. Previous work at Diamond Light Source successfully changed the X-ray beam focus and stabilised it in under 10 seconds using piezoelectric bimorph deformable mirrors. Further updates to the controls software of the programmable HV-ADAPTOS high-voltage power supply (from CAEN / S.RI. Tech) now make it possible to control individual electrodes at 1 Hz using custom voltage profiles. This allows localized compensation of piezo creep, thus improving X-ray beam shape, significantly reducing stabilisation time, and eliminating curvature drift. For ex-situ validation, dynamic changes in the surface of the bimorph mirror need to monitored in real-time with sufficient spatial sensitivity. In this paper, we show that the active optical surface of a bimorph mirror (from Thales-SESO) can be accurately changed with sub-nanometre height sensitivity by dynamically monitoring the mirror’s surface using an array of high-speed (up to 200 kHz) Zygo ZPS™ absolute interferometric displacement sensors mounted in an independent metrology frame.
|
Sep 2019
|
|
Metrology
Optics
|
Carolyn
Atkins
,
William
Brzozowski
,
Naomi
Dobson
,
Maria
Milanova
,
Stephen
Todd
,
David
Pearson
,
Cyril J.
Bourgenot
,
David
Brooks
,
Robert M.
Snell
,
Wenjuan
Sun
,
Peter
Cooper
,
Simon G.
Alcock
,
Ioana-theodora
Nistea
Abstract: Additive manufacturing (AM; 3D printing) is a fabrication process that builds an object layer-upon-layer and promotes the use of structures that would not be possible via subtractive machining. Prototype AM metal mirrors are increasingly being studied in order to exploit the advantage of the broad AM design-space to develop intricate lightweight structures that are more optimised for function than traditional open-back mirror lightweighting. This paper describes a UK Space Agency funded project to design and manufacture a series of lightweighted AM mirrors to fit within a 3U CubeSat chassis. Six AM mirrors of identical design will be presented: two in aluminium (AlSi10Mg), two in nickel phosphorous (NiP) coated AlSi10Mg, and two in titanium (Ti64). For each material mirror pair, one is hand-polished and the other is diamond turned. Metrology data, surface form error and surface roughness, will be presented to compare and contrast the different materials and post-processing methods. To assess the presence of porosity, a frequent concern for AM materials, X-ray computed tomography measurements will be presented to highlight the location and density of pores within the mirror substrates; methods to mitigate the distribution of pores near the optical surface will be described. As a metric for success the AlSi10Mg + NiP and AlSi10Mg mirrors should be suitable for visible and infrared applications respectively.
|
Sep 2019
|
|
Metrology
Optics
|
Giuseppe
Mercurio
,
Carsten
Broers
,
Robert
Carley
,
Jan Torben
Delitz
,
Natalia
Gerasimova
,
LoĂŻc
Le Guyarder
,
Laurent
Mercadier
,
Alexander
Reich
,
Justine
Schlappa
,
Martin
Teichmann
,
Alexander
Yaroslavtsev
,
Michele
Cascella
,
Kiana
Setoodehnia
,
Michael
Schneider
,
Bastian
Pfau
,
Stefan
Eisebitt
,
Vojtech
Vozda
,
Anna
Hajkova
,
Ludek
Vysin
,
Tomas
Burian
,
Jaromir
ChalupskĂ˝
,
Libor
Juha
,
Simon G.
Alcock
,
Ioana-theodora
Nistea
,
Daniele
La Civita
,
Harald
Sinn
,
Maurizio
Vannoni
,
Andreas
Scherz
Abstract: The Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL is a soft X-ray beamline aiming to unravel electronic, spin and structural properties of materials in ultrafast processes at the nanoscale. Various experimental techniques offered at SCS have different requirements in terms of beam size at the sample. Kirkpatrick-Baez (KB) refocusing optics equipped with mechanical benders allows for independent change of the horizontal and vertical beam size. We report here on the first characterization of the SCS KB mirrors by means of a novel diffraction-based technique which images the beam profile on a 2D pixelated detector. This approach provides a quick characterization of micrometer beam sizes. Results are compared with metrology measurements obtained with a non-contact slope profiler.
|
Sep 2019
|
|
Metrology
Optics
|
Carolyn
Atkins
,
William
Brzozowski
,
Naomi
Dobson
,
Maria
Milanova
,
Stephen
Todd
,
David
Pearson
,
Cyril J.
Bourgenot
,
David
Brooks
,
Robert M.
Snell
,
Wenjuan
Sun
,
Peter
Cooper
,
Simon G.
Alcock
,
Ioana
Nistea
Abstract: Design for additive manufacture (AM; 3D printing) is significantly different than design for subtractive machining. Although there are some limitations on the designs that can be printed, the increase in the AM design-space removes some of the existing challenges faced by the traditional lightweight mirror designs; for example, sandwich mirrors are just as easy to fabricate as open-back mirrors via AM, and they provide an improvement in structural rigidity. However, the ability to print a sandwich mirror as a single component does come with extra considerations; such as orientation upon the build plate and access to remove any temporary support material. This paper describes the iterations in optimisation applied to the lightweighting of a small, 84mm diameter by 20mm height, spherical concave mirror intended for CubeSat applications. The initial design, which was fabricated, is discussed in terms of the internal lightweighting design and the design constraints that were imposed by printing and post-processing. Iterations on the initial design are presented; these include the use of topology optimisation to minimise the total internal strain energy during mirror polishing and the use of lattices combined with thickness variation i.e. having a thicker lattice in strategic support locations. To assess the suitability of each design, finite element analysis is presented to quantify the print-through of the lightweighting upon the optical surface for a given mass reduction.
|
Sep 2019
|
|
I12-JEEP: Joint Engineering, Environmental and Processing
Optics
|
Diamond Proposal Number(s):
[14033]
Open Access
Abstract: High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120 keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.
|
Jun 2019
|
|
Magnets
Optics
|
Open Access
Abstract: In order to generate space for a short, out-of-vacuum multipole wiggler for the DIAD beamline, a single sextupole was removed from one of the DBA arcs in the Diamond Storage Ring during June 2018. The removal of this sextupole presented a number of challenges to the operation of the storage ring, requiring a re-optimisation of the remaining sextupole strengths*, a change in tune-point and modification of the orbit and coupling correction schemes. In this paper we describe the implementation of these changes, and provide an assessment of the impact that the installed wiggler has made on the storage ring parameters.
|
Jun 2019
|
|
