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11 items found (0 items not approved), displaying 1 to 10.[First/Prev] 1, 2 [Next/Last]

Instruments / Technical Area	Publication Details	Published
	Resolving nonequilibrium shape variations among millions of gold nanoparticles Zhou Shen , Paul Lourdu Xavier , Richard Bean , Johan Bielecki , Martin Bergemann , Benedikt Daurer , Tomas Ekeberg , Armando D. Estillore , Hans Fangohr , Klaus Giewekemeyer , Mikhail Karnevskiy , Richard A. Kirian , Henry Kirkwood , Yoonhee Kim , Jayanath C. P. Koliyadu , Holger Lange , Romain Letrun , Jannik Lübke , Abhishek Mall , Thomas Michelat , Andrew J. Morgan , Nils Roth , Amit K. Samanta , Tokushi Sato , Marcin Sikorski , Florian Schulz , Patrik Vagovic , Tamme Wollweber , Lena Worbs , Filipe Maia , Daniel A. Horke , Jochen Küpper , Adrian P. Mancuso , Henry Chapman , Kartik Ayyer , N. Duane Loh Acs Nano DOI: 10.1021/acsnano.4c00378 Open Access Show Abstract ▼ Abstract: Nanoparticles, exhibiting functionally relevant structural heterogeneity, are at the forefront of cutting-edge research. Now, high-throughput single-particle imaging (SPI) with X-ray free-electron lasers (XFELs) creates opportunities for recovering the shape distributions of millions of particles that exhibit functionally relevant structural heterogeneity. To realize this potential, three challenges have to be overcome: (1) simultaneous parametrization of structural variability in real and reciprocal spaces; (2) efficiently inferring the latent parameters of each SPI measurement; (3) scaling up comparisons between 105 structural models and 106 XFEL-SPI measurements. Here, we describe how we overcame these three challenges to resolve the nonequilibrium shape distributions within millions of gold nanoparticles imaged at the European XFEL. These shape distributions allowed us to quantify the degree of asymmetry in these particles, discover a relatively stable “shape envelope” among nanoparticles, discern finite-size effects related to shape-controlling surfactants, and extrapolate nanoparticles’ shapes to their idealized thermodynamic limit. Ultimately, these demonstrations show that XFEL SPI can help transform nanoparticle shape characterization from anecdotally interesting to statistically meaningful.	May 2024
	Revealing the origins of vortex cavitation in a Venturi tube by high speed X-ray imaging Hitoshi Soyama , Xiaoyu Liang , Wataru Yashiro , Kentaro Kajiwara , Eleni Myrto Asimakopoulou , Valerio Bellucci , Sarlota Birnsteinova , Gabriele Giovanetti , Chan Kim , Henry J. Kirkwood , Jayanath C. P. Koliyadu , Romain Letrun , Yuhe Zhang , Jozef Ulicny , Richard Bean , Adrian P. Mancuso , Pablo Villanueva-Perez , Tokushi Sato , Patrik Vagovic , Daniel Eakins , Alexander M. Korsunsky Ultrasonics Sonochemistry 101 DOI: 10.1016/j.ultsonch.2023.106715 Open Access Show Abstract ▼ Abstract: Hydrodynamic cavitation is useful in many processing applications, for example, in chemical reactors, water treatment and biochemical engineering. An important type of hydrodynamic cavitation that occurs in a Venturi tube is vortex cavitation known to cause luminescence whose intensity is closely related to the size and number of cavitation events. However, the mechanistic origins of bubbles constituting vortex cavitation remains unclear, although it has been concluded that the pressure fields generated by the cavitation collapse strongly depends on the bubble geometry. The common view is that vortex cavitation consists of numerous small spherical bubbles. In the present paper, aspects of vortex cavitation arising in a Venturi tube were visualized using high-speed X-ray imaging at SPring-8 and European XFEL. It was discovered that vortex cavitation in a Venturi tube consisted of angulated rather than spherical bubbles. The tangential velocity of the surface of vortex cavitation was assessed considering the Rankine vortex model.	Dec 2023
	Online dynamic flat-field correction for MHz microscopy data at European XFEL Sarlota Birnsteinova , Danilo E. Ferreira De Lima , Egor Sobolev , Henry J. Kirkwood , Valerio Bellucci , Richard J. Bean , Chan Kim , Jayanath C. P. Koliyadu , Tokushi Sato , Fabio Dall'Antonia , Eleni Myrto Asimakopoulou , Zisheng Yao , Khachiwan Buakor , Yuhe Zhang , Alke Meents , Henry N. Chapman , Adrian P. Mancuso , Pablo Villanueva-Perez , Patrik Vagovic Journal Of Synchrotron Radiation 30 DOI: 10.1107/S1600577523007336 Open Access Show Abstract ▼ Abstract: The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online (i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.	Nov 2023
	Laser-induced, single droplet fragmentation dynamics revealed through megahertz x-ray microscopy Fabian Reuter , Tokushi Sato , Valerio Bellucci , Sarlota Birnsteinova , Carsten Deiter , Jayanath C. P. Koliyadu , Romain Letrun , Pablo Villanueva-Perez , Richard Bean , Adrian P. Mancuso , Alke Meents , Patrik Vagovic , Claus-Dieter Ohl Physics Of Fluids 35 DOI: 10.1063/5.0171225 Open Access Show Abstract ▼ Abstract: The fragmentation dynamics of single water droplets from laser irradiation is studied with megahertz frame rate x-ray microscopy. Owed to the nearly refraction-free and penetrating imaging technique, we could look into the interior of the droplet and reveal that two mechanisms are responsible for the initial explosive fragmentation of the droplet. First, reflection and diffraction of the laser beam at the droplet interface result in the formation of laser ray caustics that lead to non-homogeneous heating of the droplet, locally above the critical temperature. Second, homogeneous cavitation in the droplet that is likely caused from shockwaves reflected as tension waves at the acoustic soft boundaries of the droplet. Further atomization occurs in three stages, first a fine sub-micrometer sized mist forms on the side of the droplet posterior to laser incidence, then micrometer sized droplets are expelled from the rim of an expanding liquid sheet, and finally into droplets of larger size through hole and ligament formation in the thinning liquid sheet where ligaments pinch off.	Nov 2023
I13-1-Coherence	Hard X-ray stereographic microscopy for single-shot differential phase imaging Valerio Bellucci , Marie-Christine Zdora , Ladislav Mikes , Šarlota Birnšteinová , Peter Oberta , Marco Romagnoni , Andrea Mazzolari , Pablo Villanueva-Perez , Rajmund Mokso , Christian David , Mikako Makita , Silvia Cipiccia , Jozef Ulicny , Alke Meents , Adrian P. Mancuso , Henry N. Chapman , Patrik Vagovic Optics Express 31 DOI: 10.1364/OE.492137 Diamond Proposal Number(s): [17739] Open Access Show Abstract ▼ Abstract: The characterisation of fast phenomena at the microscopic scale is required for the understanding of catastrophic responses of materials to loads and shocks, the processing of materials by optical or mechanical means, the processes involved in many key technologies such as additive manufacturing and microfluidics, and the mixing of fuels in combustion. Such processes are usually stochastic in nature and occur within the opaque interior volumes of materials or samples, with complex dynamics that evolve in all three dimensions at speeds exceeding many meters per second. There is therefore a need for the ability to record three-dimensional X-ray movies of irreversible processes with resolutions of micrometers and frame rates of microseconds. Here we demonstrate a method to achieve this by recording a stereo phase-contrast image pair in a single exposure. The two images are combined computationally to reconstruct a 3D model of the object. The method is extendable to more than two simultaneous views. When combined with megahertz pulse trains of X-ray free-electron lasers (XFELs) it will be possible to create movies able to resolve 3D trajectories with velocities of kilometers per second.	May 2023
	Segmented flow generator for serial crystallography at the European X-ray free electron laser Austin Echelmeier , Jorvani Cruz Villarreal , Marc Messerschmidt , Daihyun Kim , Jesse D. Coe , Darren Thifault , Sabine Botha , Ana Egatz-Gomez , Sahir Gandhi , Gerrit Brehm , Chelsie E. Conrad , Debra T. Hansen , Caleb Madsen , Saša Bajt , J. Domingo Meza-Aguilar , Dominik Oberthuer , Max O. Wiedorn , Holger Fleckenstein , Derek Mendez , Juraj Knoška , Jose M. Martin-Garcia , Hao Hu , Stella Lisova , Aschkai Allahgoli , Yaroslav Gevorkov , Kartik Ayyer , Steve Aplin , Helen M. Ginn , Heinz Graafsma , Andrew J. Morgan , Dominic Greiffenberg , Alexander Klujev , Torsten Laurus , Jennifer Poehlsen , Ulrich Trunk , Davide Mezza , Bernd Schmitt , Manuela Kuhn , Raimund Fromme , Jolanta Sztuk-Dambietz , Natascha Raab , Steffen Hauf , Alessandro Silenzi , Thomas Michelat , Chen Xu , Cyril Danilevski , Andrea Parenti , Leonce Mekinda , Britta Weinhausen , Grant Mills , Patrik Vagovic , Yoonhee Kim , Henry Kirkwood , Richard Bean , Johan Bielecki , Stephan Stern , Klaus Giewekemeyer , Adam Round , Joachim Schulz , Katerina Dörner , Thomas D. Grant , Valerio Mariani , Anton Barty , Adrian P. Mancuso , Uwe Weierstall , John C. H. Spence , Henry N. Chapman , Nadia Zatsepin , Petra Fromme , Richard A. Kirian , Alexandra Ros Nature Communications 11 DOI: 10.1038/s41467-020-18156-7 Open Access Show Abstract ▼ Abstract: Serial femtosecond crystallography (SFX) with X-ray free electron lasers (XFELs) allows structure determination of membrane proteins and time-resolved crystallography. Common liquid sample delivery continuously jets the protein crystal suspension into the path of the XFEL, wasting a vast amount of sample due to the pulsed nature of all current XFEL sources. The European XFEL (EuXFEL) delivers femtosecond (fs) X-ray pulses in trains spaced 100 ms apart whereas pulses within trains are currently separated by 889 ns. Therefore, continuous sample delivery via fast jets wastes >99% of sample. Here, we introduce a microfluidic device delivering crystal laden droplets segmented with an immiscible oil reducing sample waste and demonstrate droplet injection at the EuXFEL compatible with high pressure liquid delivery of an SFX experiment. While achieving ~60% reduction in sample waste, we determine the structure of the enzyme 3-deoxy-D-manno-octulosonate-8-phosphate synthase from microcrystals delivered in droplets revealing distinct structural features not previously reported.	Sep 2020
I03-Macromolecular Crystallography	Megahertz serial crystallography Max O. Wiedorn , Dominik Oberthuer , Richard Bean , Robin Schubert , Nadine Werner , Brian Abbey , Martin Aepfelbacher , Luigi Adriano , Aschkan Allahgholi , Nasser Al-Qudami , Jakob Andreasson , Steve Aplin , Salah Awel , Kartik Ayyer , Saša Bajt , Imrich Barák , Sadia Bari , Johan Bielecki , Sabine Botha , Djelloul Boukhelef , Wolfgang Brehm , Sandor Brockhauser , Igor Cheviakov , Matthew A. Coleman , Francisco Cruz-Mazo , Cyril Danilevski , Connie Darmanin , R. Bruce Doak , Martin Domaracky , Katerina Dörner , Yang Du , Hans Fangohr , Holger Fleckenstein , Matthias Frank , Petra Fromme , Alfonso M. Gañán-Calvo , Yaroslav Gevorkov , Klaus Giewekemeyer , Helen Mary Ginn , Heinz Graafsma , Rita Graceffa , Dominic Greiffenberg , Lars Gumprecht , Peter Göttlicher , Janos Hajdu , Steffen Hauf , Michael Heymann , Susannah Holmes , Daniel A. Horke , Mark S. Hunter , Siegfried Imlau , Alexander Kaukher , Yoonhee Kim , Alexander Klyuev , Juraj Knoška , Bostjan Kobe , Manuela Kuhn , Christopher Kupitz , Jochen Küpper , Janine Mia Lahey-Rudolph , Torsten Laurus , Karoline Le Cong , Romain Letrun , P. Lourdu Xavier , Luis Maia , Filipe R. N. C. Maia , Valerio Mariani , Marc Messerschmidt , Markus Metz , Davide Mezza , Thomas Michelat , Grant Mills , Diana C. F. Monteiro , Andrew Morgan , Kerstin Mühlig , Anna Munke , Astrid Münnich , Julia Nette , Keith A. Nugent , Theresa Nuguid , Allen M. Orville , Suraj Pandey , Gisel Pena , Pablo Villanueva-Perez , Jennifer Poehlsen , Gianpietro Previtali , Lars Redecke , Winnie Maria Riekehr , Holger Rohde , Adam Round , Tatiana Safenreiter , Iosifina Sarrou , Tokushi Sato , Marius Schmidt , Bernd Schmitt , Robert Schönherr , Joachim Schulz , Jonas A. Sellberg , M. Marvin Seibert , Carolin Seuring , Megan L. Shelby , Robert L. Shoeman , Marcin Sikorski , Alessandro Silenzi , Claudiu A. Stan , Xintian Shi , Stephan Stern , Jola Sztuk-Dambietz , Janusz Szuba , Aleksandra Tolstikova , Martin Trebbin , Ulrich Trunk , Patrik Vagovic , Thomas Ve , Britta Weinhausen , Thomas A. White , Krzysztof Wrona , Chen Xu , Oleksandr Yefanov , Nadia Zatsepin , Jiaguo Zhang , Markus Perbandt , Adrian P. Mancuso , Christian Betzel , Henry Chapman , Anton Barty Nature Communications 9 DOI: 10.1038/s41467-018-06156-7 Open Access Show Abstract ▼ Abstract: The new European X-ray Free-Electron Laser is the first X-ray free-electron laser capable of delivering X-ray pulses with a megahertz inter-pulse spacing, more than four orders of magnitude higher than previously possible. However, to date, it has been unclear whether it would indeed be possible to measure high-quality diffraction data at megahertz pulse repetition rates. Here, we show that high-quality structures can indeed be obtained using currently available operating conditions at the European XFEL. We present two complete data sets, one from the well-known model system lysozyme and the other from a so far unknown complex of a β-lactamase from K. pneumoniae involved in antibiotic resistance. This result opens up megahertz serial femtosecond crystallography (SFX) as a tool for reliable structure determination, substrate screening and the efficient measurement of the evolution and dynamics of molecular structures using megahertz repetition rate pulses available at this new class of X-ray laser source.	Oct 2018
I13-1-Coherence Metrology Optics	Inspecting adaptive optics with at-wavelength wavefront metrology J. Krempasky , U. Flechsig , P. Vagovic , C. David , F. Koch , A. Jaggi , C. Svetina , Shashidhara Marathe , D. Batey , S. Cipiccia , C. Rau , F. Seiboth , M. Seaberg , U. H. Wagner , L. Patthey , L. Mikes SPIE Optical Engineering + Applications, 2018 DOI: 10.1117/12.2320532 Diamond Proposal Number(s): [19521] Show Abstract ▼ Abstract: Preserving the coherence and wavefront of a diffraction limited x-ray beam from the source to the experiment poses stringent quality requirements on the production processes for X-ray optics. In the near future this will require on-line and in-situ at-wavelength metrology for both, free electron lasers and diffraction limited storage rings. A compact and easy to move X-ray grating interferometry (XGI) setup has been implemented by the Beamline Optics Group at PSI in order to characterize x-ray optical components by determining the aberrations from reconstructing the x-ray wavefront. The XGI setup was configured for measurements in the moire mode and tested with focusing optic at Swiss Light Source, Diamond Light Source and LCLS. In this paper measurements on a bendable toroidal mirror, a zone plate, a single and a stack of beryllium compound refractive lenses (CRL) are presented. From these measurements the focal position and quality of the beam spot in terms of wavefront distortions are determined by analysing the phase-signal obtained from the XGI measurement. In addition, using a bendable toroidal mirror, we directly compare radius of curvature measurements obtained from XGI data with data from a long-trace profilometer, and compare the CRL wavefront distortions with data obtained by ptychography.	Sep 2018
Detectors	Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light M. P. Olbinado , J. Grenzer , P. Pradel , T. De Resseguier , P. Vagovic , M.-C. Zdora , V. A. Guzenko , C. David , A. Rack Journal Of Instrumentation 13, C04004 - C04004 24th International congress on x-ray optics and microanalysis (ICXOM24) DOI: 10.1088/1748-0221/13/04/C04004 Show Abstract ▼ Abstract: We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron—ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed.	Apr 2018
B16-Test Beamline	X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers B. K. Tanner , J. Wittge , P. Vagovic , T. Baumbach , D. Allen , P. J. Mcnally , R. Bytheway , D. Jacques , M. C. Fossati , D. K. Bowen , J. Garagorri , M. R. Elizalde , A. N. Danilewsky Powder Diffraction 28 (2), 95 - 99 DOI: 10.1017/S0885715613000122 Show Abstract ▼ Abstract: The apparatus for X-ray diffraction imaging (XRDI) of 450-mm wafers, is now placed at the ANKA synchrotron radiation source in Karlsruhe, is described in the context of the drive to inspect wafers for plastic deformation or mechanical damage. It is shown that full wafer maps at high resolution can be expected to take a few hours to record. However, we show from experiments on 200-, 300-, and 450-mm wafers that a perimeter-scan on a 450-mm wafer, to pick up edge damage and edge-originated slip sources, can be achieved in just over 10 min. Experiments at the Diamond Light Source, on wafers still in their cassettes, suggest that clean-room conditions may not be necessary for such characterization. We conclude that scaling up of the 300-mm format Jordan Valley tools, together with the existing facility at ANKA, provides satisfactory capability for future XRDI analysis of 450-mm wafers.	Jun 2013

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