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Instruments / Technical Area	Publication Details	Published
	Segmented flow generator for serial crystallography at the European X-ray free electron laser Austin Echelmeier , Jorvani Cruz Villarreal , Marc Messerschmidt , Daihyun Kim , Jesse D. Coe , Darren Thifault , Sabine Botha , Ana Egatz-Gomez , Sahir Gandhi , Gerrit Brehm , Chelsie E. Conrad , Debra T. Hansen , Caleb Madsen , Saša Bajt , J. Domingo Meza-Aguilar , Dominik Oberthuer , Max O. Wiedorn , Holger Fleckenstein , Derek Mendez , Juraj Knoška , Jose M. Martin-Garcia , Hao Hu , Stella Lisova , Aschkai Allahgoli , Yaroslav Gevorkov , Kartik Ayyer , Steve Aplin , Helen M. Ginn , Heinz Graafsma , Andrew J. Morgan , Dominic Greiffenberg , Alexander Klujev , Torsten Laurus , Jennifer Poehlsen , Ulrich Trunk , Davide Mezza , Bernd Schmitt , Manuela Kuhn , Raimund Fromme , Jolanta Sztuk-Dambietz , Natascha Raab , Steffen Hauf , Alessandro Silenzi , Thomas Michelat , Chen Xu , Cyril Danilevski , Andrea Parenti , Leonce Mekinda , Britta Weinhausen , Grant Mills , Patrik Vagovic , Yoonhee Kim , Henry Kirkwood , Richard Bean , Johan Bielecki , Stephan Stern , Klaus Giewekemeyer , Adam Round , Joachim Schulz , Katerina Dörner , Thomas D. Grant , Valerio Mariani , Anton Barty , Adrian P. Mancuso , Uwe Weierstall , John C. H. Spence , Henry N. Chapman , Nadia Zatsepin , Petra Fromme , Richard A. Kirian , Alexandra Ros Nature Communications 11 DOI: 10.1038/s41467-020-18156-7 Open Access Show Abstract ▼ Abstract: Serial femtosecond crystallography (SFX) with X-ray free electron lasers (XFELs) allows structure determination of membrane proteins and time-resolved crystallography. Common liquid sample delivery continuously jets the protein crystal suspension into the path of the XFEL, wasting a vast amount of sample due to the pulsed nature of all current XFEL sources. The European XFEL (EuXFEL) delivers femtosecond (fs) X-ray pulses in trains spaced 100 ms apart whereas pulses within trains are currently separated by 889 ns. Therefore, continuous sample delivery via fast jets wastes >99% of sample. Here, we introduce a microfluidic device delivering crystal laden droplets segmented with an immiscible oil reducing sample waste and demonstrate droplet injection at the EuXFEL compatible with high pressure liquid delivery of an SFX experiment. While achieving ~60% reduction in sample waste, we determine the structure of the enzyme 3-deoxy-D-manno-octulosonate-8-phosphate synthase from microcrystals delivered in droplets revealing distinct structural features not previously reported.	Sep 2020
I03-Macromolecular Crystallography	Megahertz serial crystallography Max O. Wiedorn , Dominik Oberthuer , Richard Bean , Robin Schubert , Nadine Werner , Brian Abbey , Martin Aepfelbacher , Luigi Adriano , Aschkan Allahgholi , Nasser Al-qudami , Jakob Andreasson , Steve Aplin , Salah Awel , Kartik Ayyer , Saša Bajt , Imrich Barák , Sadia Bari , Johan Bielecki , Sabine Botha , Djelloul Boukhelef , Wolfgang Brehm , Sandor Brockhauser , Igor Cheviakov , Matthew A. Coleman , Francisco Cruz-mazo , Cyril Danilevski , Connie Darmanin , R. Bruce Doak , Martin Domaracky , Katerina Dörner , Yang Du , Hans Fangohr , Holger Fleckenstein , Matthias Frank , Petra Fromme , Alfonso M. Gañán-calvo , Yaroslav Gevorkov , Klaus Giewekemeyer , Helen Mary Ginn , Heinz Graafsma , Rita Graceffa , Dominic Greiffenberg , Lars Gumprecht , Peter Göttlicher , Janos Hajdu , Steffen Hauf , Michael Heymann , Susannah Holmes , Daniel A. Horke , Mark S. Hunter , Siegfried Imlau , Alexander Kaukher , Yoonhee Kim , Alexander Klyuev , Juraj Knoška , Bostjan Kobe , Manuela Kuhn , Christopher Kupitz , Jochen Küpper , Janine Mia Lahey-rudolph , Torsten Laurus , Karoline Le Cong , Romain Letrun , P. Lourdu Xavier , Luis Maia , Filipe R. N. C. Maia , Valerio Mariani , Marc Messerschmidt , Markus Metz , Davide Mezza , Thomas Michelat , Grant Mills , Diana C. F. Monteiro , Andrew Morgan , Kerstin Mühlig , Anna Munke , Astrid Münnich , Julia Nette , Keith A. Nugent , Theresa Nuguid , Allen M. Orville , Suraj Pandey , Gisel Pena , Pablo Villanueva-perez , Jennifer Poehlsen , Gianpietro Previtali , Lars Redecke , Winnie Maria Riekehr , Holger Rohde , Adam Round , Tatiana Safenreiter , Iosifina Sarrou , Tokushi Sato , Marius Schmidt , Bernd Schmitt , Robert Schönherr , Joachim Schulz , Jonas A. Sellberg , M. Marvin Seibert , Carolin Seuring , Megan L. Shelby , Robert L. Shoeman , Marcin Sikorski , Alessandro Silenzi , Claudiu A. Stan , Xintian Shi , Stephan Stern , Jola Sztuk-dambietz , Janusz Szuba , Aleksandra Tolstikova , Martin Trebbin , Ulrich Trunk , Patrik Vagovic , Thomas Ve , Britta Weinhausen , Thomas A. White , Krzysztof Wrona , Chen Xu , Oleksandr Yefanov , Nadia Zatsepin , Jiaguo Zhang , Markus Perbandt , Adrian P. Mancuso , Christian Betzel , Henry Chapman , Anton Barty Nature Communications 9 DOI: 10.1038/s41467-018-06156-7 Open Access Show Abstract ▼ Abstract: The new European X-ray Free-Electron Laser is the first X-ray free-electron laser capable of delivering X-ray pulses with a megahertz inter-pulse spacing, more than four orders of magnitude higher than previously possible. However, to date, it has been unclear whether it would indeed be possible to measure high-quality diffraction data at megahertz pulse repetition rates. Here, we show that high-quality structures can indeed be obtained using currently available operating conditions at the European XFEL. We present two complete data sets, one from the well-known model system lysozyme and the other from a so far unknown complex of a β-lactamase from K. pneumoniae involved in antibiotic resistance. This result opens up megahertz serial femtosecond crystallography (SFX) as a tool for reliable structure determination, substrate screening and the efficient measurement of the evolution and dynamics of molecular structures using megahertz repetition rate pulses available at this new class of X-ray laser source.	Oct 2018
I13-1-Coherence Metrology Optics	Inspecting adaptive optics with at-wavelength wavefront metrology J. Krempasky , U. Flechsig , P. Vagovic , C. David , F. Koch , A. Jaggi , C. Svetina , Shashidhara Marathe , D. Batey , S. Cipiccia , C. Rau , F. Seiboth , M. Seaberg , U. H. Wagner , L. Patthey , L. Mikes SPIE Optical Engineering + Applications, 2018 DOI: 10.1117/12.2320532 Diamond Proposal Number(s): [19521] Show Abstract ▼ Abstract: Preserving the coherence and wavefront of a diffraction limited x-ray beam from the source to the experiment poses stringent quality requirements on the production processes for X-ray optics. In the near future this will require on-line and in-situ at-wavelength metrology for both, free electron lasers and diffraction limited storage rings. A compact and easy to move X-ray grating interferometry (XGI) setup has been implemented by the Beamline Optics Group at PSI in order to characterize x-ray optical components by determining the aberrations from reconstructing the x-ray wavefront. The XGI setup was configured for measurements in the moire mode and tested with focusing optic at Swiss Light Source, Diamond Light Source and LCLS. In this paper measurements on a bendable toroidal mirror, a zone plate, a single and a stack of beryllium compound refractive lenses (CRL) are presented. From these measurements the focal position and quality of the beam spot in terms of wavefront distortions are determined by analysing the phase-signal obtained from the XGI measurement. In addition, using a bendable toroidal mirror, we directly compare radius of curvature measurements obtained from XGI data with data from a long-trace profilometer, and compare the CRL wavefront distortions with data obtained by ptychography.	Sep 2018
Detectors	Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light M. P. Olbinado , J. Grenzer , P. Pradel , T. De Resseguier , P. Vagovic , M.-c. Zdora , V. A. Guzenko , C. David , A. Rack Journal Of Instrumentation 13, C04004 - C04004 24th International congress on x-ray optics and microanalysis (ICXOM24) DOI: 10.1088/1748-0221/13/04/C04004 Show Abstract ▼ Abstract: We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron—ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed.	Apr 2018
B16-Test Beamline	X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers B. K. Tanner , J. Wittge , P. Vagovic , T. Baumbach , D. Allen , P. J. Mcnally , R. Bytheway , D. Jacques , M. C. Fossati , D. K. Bowen , J. Garagorri , M. R. Elizalde , A. N. Danilewsky Powder Diffraction 28 (2), 95 - 99 DOI: 10.1017/S0885715613000122 Show Abstract ▼ Abstract: The apparatus for X-ray diffraction imaging (XRDI) of 450-mm wafers, is now placed at the ANKA synchrotron radiation source in Karlsruhe, is described in the context of the drive to inspect wafers for plastic deformation or mechanical damage. It is shown that full wafer maps at high resolution can be expected to take a few hours to record. However, we show from experiments on 200-, 300-, and 450-mm wafers that a perimeter-scan on a 450-mm wafer, to pick up edge damage and edge-originated slip sources, can be achieved in just over 10 min. Experiments at the Diamond Light Source, on wafers still in their cassettes, suggest that clean-room conditions may not be necessary for such characterization. We conclude that scaling up of the 300-mm format Jordan Valley tools, together with the existing facility at ANKA, provides satisfactory capability for future XRDI analysis of 450-mm wafers.	Jun 2013
B16-Test Beamline	High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector Patrik Vagovic , Dusan Korytar , Angelica Cecilia , Elias Hamann , Libor Sveda , Daniele Pelliccia , Jurgen Hartwig , Peter Oberta , Igor Dolbnya , Kawal Sawhney , Uwe Fleschig , Michael Fiederle , Tilo Baumbach Journal Of Synchrotron Radiation DOI: 10.1107/S0909049512044366 PMID: 23254668 Diamond Proposal Number(s): [7662] Show Abstract ▼ Abstract: The performance of a recently developed full-field X-ray micro-imaging system based on an in-line Bragg magnifier is reported. The system is composed of quasi-channel-cut crystals in combination with a Medipix single-photon-counting detector. A theoretical and experimental study of the imaging performance of the crystals-detector combination and a comparison with a standard indirect detector typically used in high-resolution X-ray imaging schemes are reported. The spatial resolution attained by our system is about 0.75 µm, limited only by the current magnification. Compared with an indirect detector system, this system features a better efficiency, signal-to-noise ratio and spatial resolution. The optimal working resolution range of this system is between 0.4 µm and 1 µm, filling the gap between transmission X-ray microscopes and indirect detectors. Applications for coherent full-field imaging of weakly absorbing samples are shown and discussed.	Nov 2012

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