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Instruments / Technical Area	Publication Details	Published	Actions
	Online dynamic flat-field correction for MHz microscopy data at European XFEL Sarlota Birnsteinova , Danilo E. Ferreira De Lima , Egor Sobolev , Henry J. Kirkwood , Valerio Bellucci , Richard J. Bean , Chan Kim , Jayanath C. P. Koliyadu , Tokushi Sato , Fabio Dall'Antonia , Eleni Myrto Asimakopoulou , Zisheng Yao , Khachiwan Buakor , Yuhe Zhang , Alke Meents , Henry N. Chapman , Adrian P. Mancuso , Pablo Villanueva-Perez , Patrik Vagovic Journal Of Synchrotron Radiation 30 DOI: 10.1107/S1600577523007336 Open Access Show Abstract ▼ Abstract: The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online (i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.	Nov 2023
I13-1-Coherence	Hard X-ray stereographic microscopy for single-shot differential phase imaging Valerio Bellucci , Marie-Christine Zdora , Ladislav Mikes , Šarlota Birnšteinová , Peter Oberta , Marco Romagnoni , Andrea Mazzolari , Pablo Villanueva-Perez , Rajmund Mokso , Christian David , Mikako Makita , Silvia Cipiccia , Jozef Ulicny , Alke Meents , Adrian P. Mancuso , Henry N. Chapman , Patrik Vagovic Optics Express 31 DOI: 10.1364/OE.492137 Diamond Proposal Number(s): [17739] Open Access Show Abstract ▼ Abstract: The characterisation of fast phenomena at the microscopic scale is required for the understanding of catastrophic responses of materials to loads and shocks, the processing of materials by optical or mechanical means, the processes involved in many key technologies such as additive manufacturing and microfluidics, and the mixing of fuels in combustion. Such processes are usually stochastic in nature and occur within the opaque interior volumes of materials or samples, with complex dynamics that evolve in all three dimensions at speeds exceeding many meters per second. There is therefore a need for the ability to record three-dimensional X-ray movies of irreversible processes with resolutions of micrometers and frame rates of microseconds. Here we demonstrate a method to achieve this by recording a stereo phase-contrast image pair in a single exposure. The two images are combined computationally to reconstruct a 3D model of the object. The method is extendable to more than two simultaneous views. When combined with megahertz pulse trains of X-ray free-electron lasers (XFELs) it will be possible to create movies able to resolve 3D trajectories with velocities of kilometers per second.	May 2023

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