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Instruments / Technical Area	Publication Details	Published
B16-Test Beamline	Modelling needle domains with dislocations: A dislocation pile-up model and comparison with synchrotron experiment D. Sui , J. Zhou , J. E. Huber European Journal Of Mechanics - A/solids 100 DOI: 10.1016/j.euromechsol.2023.105020 Diamond Proposal Number(s): [6092] Show Abstract ▼ Abstract: The shape and strain field of a needle domain in a barium titanate single crystal are modelled using a distribution of dislocations and line charges. The arrangement of these dislocations and charges is a result of the balance of modified Peach-Koehler forces acting among the dislocations and a lattice friction assumed to act at each dislocation site. Based on measurements of needle shape by synchrotron X-ray diffraction, dislocation pile-up theory is used to compute the distribution of discrete dislocations along the needle and hence estimate the lattice friction. It is found that the lattice friction in this model is proportional to the opening angle of a wedge-shape needle domain and consistent with the observed magnitude of stress required to mobilize needle domains. The microstrain distribution around an a-a needle domain tip, obtained from X-ray diffraction measurement, is further used to test the dislocation model, with a similar pattern and magnitude of strains identified in the model and the experiment.	May 2023
I12-JEEP: Joint Engineering, Environmental and Processing	Use of synchrotron X-rays for direct observation of wear damage in optically-opaque contacts by means of CT imaging and X-ray diffraction J. Aleksejev , M. Williamson , J. E. Huber , O. V. Magdysyuk , S. Michalik , T. J. Marrow Tribology International vol. 470 DOI: 10.1016/j.triboint.2022.107809 Diamond Proposal Number(s): [27537] Show Abstract ▼ Abstract: In a simulated in-situ experiment annular contacts of 6082-T6 aluminium alloy were first exposed to various degrees of fretting wear, before synchrotron X-ray CT and diffraction were applied to examine the extent and development of wear damage. The wear volumes measured and development of the wear rate were consistent with the mathematical wear model of Fillot, Iordanoff & Berthier. Thickness and porosity of the worn zone were measured and the contact area between wearing elements estimated. Developments of residual strain and tribologically transformed structure were investigated through X-ray diffraction. This study demonstrates, for the first time, the value and viability of observing and quantifying wear through combination of X-ray CT and diffraction opening a path towards in-situ observations of wear.	Jul 2022
B16-Test Beamline Optics	Mapping of domain structure in Barium Titanate single crystals by synchrotron X-ray topography Prashant Potnis , John Huber , Felix Hofmann , Alexander Korsunsky , John P. Sutter , Brian Abbey Smart Structures and Materials & Nondestructive Evaluation and Health Monitoring, SPIE 2010, San Diego DOI: 10.1117/12.845837 Diamond Proposal Number(s): [1006] Show Abstract ▼ Abstract: Imaging of domains is a key step in understanding the microstructure and hence the properties of ferroelectric single crystals. This understanding is essential for exploiting engineered domain configurations to achieve enhanced performance. In this paper, single crystals of Barium Titanate are observed by reflection topography using unfocussed monochromatic synchrotron X-ray light. A 10 x 10 mm polished surface of an unpoled crystal was mapped to form a composite image, indicating a fine structure of a- and c-domains. By making use of the angular separation of the diffracted reflections and specimen rocking, the relative tilts between adjacent domains about two orthogonal axes were found. Angular resolution better than 0.1mrad in tilt measurements allowed the local elastic curvature of lattice planes to be observed. The resulting composite images show well defined boundaries between regions of distinct microstructure, and give an indication of the proportion of the domain types present. Over large regions of the crystal the domain structure was finer than the X-ray camera resolution of 6.5?m; AFM and SEM imaging of domains was then used to confirm the typical domain spacing. The results are interpreted in the context of models of compatible microstructure in tetragonal crystals using microscopy of etched crystals to assist the interpretation. The technique shows promise for mapping fine microstructure in single crystals, through the use of high resolution X-ray cameras, and is successful in revealing lattice orientation information that is not normally available in optical or AFM measurements.	Mar 2010

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