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Instruments / Technical Area	Publication Details	Published	Actions
B16-Test Beamline Optics	Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source Thomas E. J. Moxham , Aaron Parsons , Tunhe Zhou , Lucia Alianelli , Hongchang Wang , David Laundy , Vishal Dhamgaye , Oliver J. L. Fox , Kawal Sawhney , Alexander M. Korsunsky Journal Of Synchrotron Radiation 27 DOI: 10.1107/S1600577520012151 Open Access Show Abstract ▼ Abstract: Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a modal decomposition of the illuminating probe and relax the restriction of using sources with high spatial coherence. In this article a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes is demonstrated experimentally. A strongly diffracting Siemens star test sample is imaged using the focused beam produced by either a Fresnel zone plate or beryllium compound refractive lens. The recovered probe from each optic is back propagated in order to plot the beam caustic and determine the precise focal size and position. The power distribution of the reconstructed probe modes also allows the quantification of the beams coherence and is compared with the values predicted by a Gaussian–Schell model and the optics exit intensity.	Nov 2020
Optics	Applications of laboratory-based phase-contrast imaging using speckle tracking technique towards high energy x-rays Tunhe Zhou , Fei Yang , Rolf Kaufmann , Hongchang Wang Journal Of Imaging 4 DOI: 10.3390/jimaging4050069 Open Access Show Abstract ▼ Abstract: The recently developed speckle-based technique is a promising candidate for laboratory-based X-ray phase-contrast imaging due to its compatibility with polychromatic X-rays, multi-modality and flexibility. Previously, successful implementations of the method on laboratory systems have been shown mostly with energies less than 20 keV on samples with materials like soft tissues or polymer. Higher energy X-rays are needed for penetrating materials with a higher atomic number or that are thicker in size. A first demonstration using high energy X-rays was recently given. Here, we present more potential application examples, i.e., a multi-contrast imaging of an IC chip and a phase tomography of a mortar sample, at an average photon energy of 40 keV using a laboratory X-ray tube. We believe the results demonstrate the applicability of this technique in a wide range of fields for non-destructive examination in industry and material science.	May 2018

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