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Instruments / Technical Area	Publication Details	Published	Actions
E02-JEM ARM 300CF	Low-dose phase retrieval of biological specimens using cryo-electron ptychography Liqi Zhou , Jingdong Song , Judy S. Kim , Xudong Pei , Chen Huang , Mark Boyce , Luiza Mendonca , Daniel Clare , Alistair Siebert , Christopher Allen , Emanuela Liberti , David Stuart , Xiaoqing Pan , Peter Nellist , Peijun Zhang , Angus Kirkland , Peng Wang Nature Communications 11 DOI: 10.1038/s41467-020-16391-6 Diamond Proposal Number(s): [19243, 20431, 20961, 22317] Open Access Show Abstract ▼ Abstract: Cryo-electron microscopy is an essential tool for high-resolution structural studies of biological systems. This method relies on the use of phase contrast imaging at high defocus to improve information transfer at low spatial frequencies at the expense of higher spatial frequencies. Here we demonstrate that electron ptychography can recover the phase of the specimen with continuous information transfer across a wide range of the spatial frequency spectrum, with improved transfer at lower spatial frequencies, and as such is more efficient for phase recovery than conventional phase contrast imaging. We further show that the method can be used to study frozen-hydrated specimens of rotavirus double-layered particles and HIV-1 virus-like particles under low-dose conditions (5.7 e/Å2) and heterogeneous objects in an Adenovirus-infected cell over large fields of view (1.14 × 1.14 μm), thus making it suitable for studies of many biologically important structures.	Jun 2020
E02-JEM ARM 300CF	Filamentary high-resolution electrical probes for nanoengineering Eugene J. H. Soh , Ghazi Syed , Giulio Mazzotta , Benjamin F. Porter , Moritz Riede , Robin Nicholas , Judy S. Kim , Harish Bhaskaran Nano Letters DOI: 10.1021/acs.nanolett.9b04302 Diamond Proposal Number(s): [22207] Show Abstract ▼ Abstract: Confining electric fields to a nanoscale region is challenging yet crucial for applications such as high resolution probing of electrical properties of materials and electric-field manipulation of nanoparticles. State-of-the-art techniques involving atomic force microscopy typically have a lateral resolution limit of tens of nanometers due to limitations in the probe geometry and stray electric fields that extend over space. Engineering the probes is the most direct approach to improving this resolution limit. However, current methods to fabricate high-resolution probes, which can effectively confine the electric fields laterally involve expensive and sophisticated probe manipulation, which has limited the use of this approach. Here, we demonstrate that nanoscale phase switching of configurable thin films on probes can result in high-resolution electrical probes. These configurable coatings can be both germanium-antimony-tellurium (GST) as well as amorphous-carbon, materials known to undergo electric field-induced non-volatile, yet reversible switching. By forming a localized conductive filament through phase transition, we demonstrate a spatial resolution of electrical field beyond the geometrical limitations of commercial platinum probes (i.e. an improvement of ~48%). We then utilize these confined electric fields to manipulate nanoparticles with single nanoparticle precision via dielectrophoresis. Our results advance the field of nanomanufacturing and metrology with direct applications for pick and place assembly at the nanoscale.	Jan 2020

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