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Instruments / Technical Area	Publication Details	Published
I13-1-Coherence	Evaluation of the weighted mean X-ray energy for an imaging system via propagation-based phase-contrast imaging Maria Seifert , Mareike Weule , Silvia Cipiccia , Veronika Ludwig , Thilo Michel , Paul Neumayer , Max Schuster , Andreas Wolf , Gisela Anton , Stefan Funk , Bernhard Akstaller Journal Of Imaging 6 DOI: 10.3390/jimaging6070063 Diamond Proposal Number(s): [18540] Open Access Show Abstract ▼ Abstract: For imaging events of extremely short duration, like shock waves or explosions, it is necessary to be able to image the object with a single-shot exposure. A suitable setup is given by a laser-induced X-ray source such as the one that can be found at GSI (Helmholtzzentrum für Schwerionenforschung GmbH) in Darmstadt (Society for Heavy Ion Research), Germany. There, it is possible to direct a pulse from the high-energy laser Petawatt High Energy Laser for Heavy Ion eXperiments (PHELIX) on a tungsten wire to generate a picosecond polychromatic X-ray pulse, called backlighter. For grating-based single-shot phase-contrast imaging of shock waves or exploding wires, it is important to know the weighted mean energy of the X-ray spectrum for choosing a suitable setup. In propagation-based phase-contrast imaging the knowledge of the weighted mean energy is necessary to be able to reconstruct quantitative phase images of unknown objects. Hence, we developed a method to evaluate the weighted mean energy of the X-ray backlighter spectrum using propagation-based phase-contrast images. In a first step wave-field simulations are performed to verify the results. Furthermore, our evaluation is cross-checked with monochromatic synchrotron measurements with known energy at Diamond Light Source (DLS, Didcot, UK) for proof of concepts.	Jul 2020
Optics	Applications of laboratory-based phase-contrast imaging using speckle tracking technique towards high energy x-rays Tunhe Zhou , Fei Yang , Rolf Kaufmann , Hongchang Wang Journal Of Imaging 4 DOI: 10.3390/jimaging4050069 Open Access Show Abstract ▼ Abstract: The recently developed speckle-based technique is a promising candidate for laboratory-based X-ray phase-contrast imaging due to its compatibility with polychromatic X-rays, multi-modality and flexibility. Previously, successful implementations of the method on laboratory systems have been shown mostly with energies less than 20 keV on samples with materials like soft tissues or polymer. Higher energy X-rays are needed for penetrating materials with a higher atomic number or that are thicker in size. A first demonstration using high energy X-rays was recently given. Here, we present more potential application examples, i.e., a multi-contrast imaging of an IC chip and a phase tomography of a mortar sample, at an average photon energy of 40 keV using a laboratory X-ray tube. We believe the results demonstrate the applicability of this technique in a wide range of fields for non-destructive examination in industry and material science.	May 2018
	State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging Marie-christine Zdora Journal Of Imaging 4 DOI: 10.3390/jimaging4050060 Open Access Show Abstract ▼ Abstract: In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given.	Apr 2018

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