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Instruments / Technical Area	Publication Details	Published
I06-Nanoscience Optics	High reflectance Cr/C multilayer at 250eV for soft X-ray polarimetry Mingwu Wen , Li Jiang , Zhong Zhang , Qiushi Huang , Zhanshan Wang , Rui She , Hua Feng , Hongchang Wang Thin Solid Films DOI: 10.1016/j.tsf.2015.06.005 Diamond Proposal Number(s): [5028] Show Abstract ▼ Abstract: X-ray reflection near 45° via multilayer mirrors can be used for astronomical polarization measurements. A Cr/C multilayer mirror (designed for X-ray polarimetry at 250 eV), with a period thickness of 3.86 nm and a bi-layer number of 100, was fabricated using direct current magnetron sputtering. Grazing incidence X-ray reflectometry at 8 keV and transmission electron microscopy were used to investigate the multilayer structure. Different models were introduced to fit the hard X-ray reflectivity curve, which indicates that the layer thickness of two materials slightly drifts from the bottom to the top of the stack. Both the chromium and carbon layers are amorphous with asymmetric interfaces, while the Cr-on-C interface is slightly wider. Based on the good quality of the multilayer structure, a high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV at a grazing incidence angle of 40.7°. The fabricated Cr/C multilayer mirror exhibits high reflectivity and polarization levels in the energy region of 240 eV–260 eV.	Jun 2015
B18-Core EXAFS	Electrochromic performances of nonstoichiometric NiO thin films H. Moulki , C. Faure , M. Mihelcic , A. Surca Vuk , F. Svegl , B. Orel , G. Campet , M. Alfredsson , A. V. Chadwick , D. Gianolio , A. Rougier Thin Solid Films DOI: 10.1016/j.tsf.2013.10.154 Show Abstract ▼ Abstract: Electrochromic (EC) performances of Ni3 + containing NiO thin films, called modified NiO thin films, prepared either by pulsed laser deposition or by chemical route are reported. When cycled in lithium based electrolyte, the comparison of the EC behavior of nonstoichiometric NiO thin films points out a larger optical contrast for the films synthesized by chemical route with the absence of an activation period on early electrochemical cycling due in particular to a larger porosity. Herein we demonstrate faster kinetics for modified NiO thin films cycled in lithium ion free electrolyte. Finally, X-ray absorption spectroscopy is used for a preliminary understanding of the mechanism involved in this original EC behavior linked to the film characteristics including their disorder character, the presence of Ni3 + and their porous morphology.	Nov 2013
I11-High Resolution Powder Diffraction	Hybrid chemical vapour and nanoceramic aerosol assisted deposition for multifunctional nanocomposite thin films Michael E. A. Warwick , Charles W. Dunnill , Josie Goodall , Jawwad A. Darr , Russell Binions Thin Solid Films 519 (18), 5942 - 5948 DOI: 10.1016/j.tsf.2011.03.028 Show Abstract ▼ Abstract: Hybrid atmospheric pressure chemical vapour and aerosol assisted deposition via the reaction of vanadium acetylacetonate and a suspension of preformed titanium dioxide or cerium dioxide nanoparticles, led to the production of vanadium dioxide nanocomposite thin films on glass substrates. The preformed nanoparticle oxides used for the aerosol were synthesised using a continuous hydrothermal flow synthesis route involving the rapid reaction of a metal salt solution with a flow of supercritical water in a flow reactor. Multifunctional nanocomposite thin films from the hybrid deposition process were characterised using scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy. The functional properties of the films were evaluated using variable temperature optical measurements to assess thermochromic behaviour and methylene blue photodecolourisation experiments to assess photocatalytic activity. The tests show that the films are multifunctional in that they are thermochromic (having a large change in infra-red reflectivity upon exceeding the thermochromic transition temperature) and have significant photocatalytic activity under irradiation with 254 nm light.	Jul 2011
I11-High Resolution Powder Diffraction	Monolayer structures of alkyl aldehydes: Odd-membered homologues T. K. Phillips , S. M. Clarke , T. Bhinde , M. A. Castro , C. Millan , S. Medina Thin Solid Films DOI: 10.1016/j.tsf.2010.12.084 Show Abstract ▼ Abstract: The existence of solid monolayers formed at the interface between substrate and liquid bulk adsorbate is confirmed for C11 aldehyde using incoherent neutron scattering. Crystalline monolayers of three aldehydes with an odd number of carbon atoms in the alkyl chain (C7, C9 and C11) at low coverages are observed by a combination of x-ray and neutron diffraction. Analysis of the diffraction data is discussed and possible monolayer crystal structures are proposed, although unique structures could not be ascertained for all molecules. We conclude that the structures are flat on the surface, with the molecules lying in the plane of the layer. The C11 homologue is determined to have a plane group of either p2, pgb or pgg, and for the C7 homologue the p2 plane group is preferred.	Mar 2011
	An investigation of the growth and removal of protective antimony caps for antimonide epilayers S. G. Alcock , M. J. Everard , C. L. Nicklin , J. S. G. Taylor , C. A. Norris , S. L. Bennett Thin Solid Films 514, 198-203 DOI: 10.1016/j.tsf.2006.02.083 Show Abstract ▼ Abstract: We present a surface X-ray diffraction and Auger electron spectroscopy investigation of antimony capping layers used to protect indium antimonide and gallium antimonide epilayers. A thermally induced amorphous to polycrystalline structural transition was observed at approximately 190 °C for Sb caps on InSb(0 0 1) and GaSb(0 0 1) substrates. We conclude that 100 nm Sb caps deposited at elevated substrate temperature (150–200 °C) have superior structural order, and are able to protect III-Sb epilayers from atmospheric contamination for periods of at least a year.	Aug 2006
	A comparative study of Cu–Se and In–Se bond length distributions in CuInSe2 with related In-rich compounds J. M. Merino , S. Diaz-Moreno , G. Subias , M. León Thin Solid Films 480-481, 295 - 300 DOI: 10.1016/j.tsf.2004.11.004 Show Abstract ▼ Abstract: The local atomic structure around the Cu and In atoms of CuInSe2 (CIS), Cu2In4Se7 and CuIn3Se5 was studied using Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy at the Cu and In K-edges. Room and low-temperature EXAFS measurements were performed at beamline BM29 at the European Synchrotron Radiation Facility (ESRF) and collected data were analysed using the freely available IFEFFIT package. The analysis assumed a chalcopyrite structure for the CuInSe2 samples while different structures (Cahlcopyrite and P-chalcopyrite) were tried for Cu2In4Se7 and CuIn3Se5. The results show that the In–Se bond length remains constant in the CuInSe2 samples within the experimental uncertainty but slight differences are observed in the Cu–Se bond lengths. These decrease with the Cu content in accordance with previous X-ray diffraction (XRD) results on the same samples. The values obtained for the Debye–Waller factors in the CuInSe2 samples are lower for the In–Se bond compared to Cu–Se, which is consistent with a higher ionicity in the former bond.	Jun 2005

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