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35 items found (0 items not approved), displaying 31 to 35.[First/Prev] 1, 2, 3, 4 [Next/Last]

Instruments / Technical Area	Publication Details	Published
B16-Test Beamline	On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors Anton Kachatkou , Roelof van Silfhout Optics Express 21 (4) DOI: 10.1364/OE.21.004291 PMID: 23481962 Show Abstract ▼ Abstract: We present a theoretical model that describes the resolution and linearity of a novel transparent X-ray beam imaging and position measurement method. Using a pinhole or coded aperture camera with pixelated area sensors to image a small fraction of radiation scattered by a thin foil placed at oblique angles with respect to the beam, a very precise measurement of the beam position is made. We show that the resolution of the method is determined by incident beam intensity, beam size, camera parameters, sensor pixel size and noise. The model is verified experimentally showing a sub-micrometer resolution over a large linear range.	Feb 2013
B16-Test Beamline Optics	X-ray wavefront characterization using a rotating shearing interferometer technique Hongchang Wang , Kawal Sawhney , Sebastien Berujon , Eric Ziegler , Simon Rutishauser , Christian David Optics Express 19 (17), 16550-16559 DOI: 10.1364/OE.19.016550 PMID: 21935019 Show Abstract ▼ Abstract: A fast and accurate method to characterize the X-ray wavefront by rotating one of the two gratings of an X-ray shearing interferometer is described and investigated step by step. Such a shearing interferometer consists of a phase grating mounted on a rotation stage, and an absorption grating used as a transmission mask. The mathematical relations for X-ray Moiré fringe analysis when using this device are derived and discussed in the context of the previous literature assumptions. X-ray beam wavefronts without and after X-ray reflective optical elements have been characterized at beamline B16 at Diamond Light Source (DLS) using the presented X-ray rotating shearing interferometer (RSI) technique. It has been demonstrated that this improved method allows accurate calculation of the wavefront radius of curvature and the wavefront distortion, even when one has no previous information on the grating projection pattern period, magnification ratio and the initial grating orientation. As the RSI technique does not require any a priori knowledge of the beam features, it is suitable for routine characterization of wavefronts of a wide range of radii of curvature.	Aug 2011
I06-Nanoscience	Magnetic imaging by x-ray holography using extended references Thomas Duckworth , Feodor Ogrin , Sean Langridge , Amy Whiteside , Thomas Moore , Guillaume Beutier , Sarnjeet S. Dhesi , Gerrit Van Der Laan Optics Express 19 (17), 16223-16228 DOI: 10.1364/OE.19.016223 PMID: 21934984 Show Abstract ▼ Abstract: We demonstrate magnetic lensless imaging by Fourier transform holography using extended references. A narrow slit milled through an opaque gold mask is used as a holographic reference and magnetic contrast is obtained by x-ray magnetic circular dichroism. We present images of magnetic domains in a Co/Pt multilayer thin film with perpendicular magnetic anisotropy. This technique holds advantages over standard Fourier transform holography, where small holes are used to define the reference beam. An increased intensity through the extended reference reduces the counting time to record the farfield diffraction pattern. Additionally it was found that manufacturing narrow slits is less technologically demanding than the same procedure for holes. We achieve a spatial resolution of ∼30 nm, which was found to be limited by the sample period of the chosen experimental setup	Aug 2011
Optics	High efficiency nano-focusing kinoform optics for synchrotron radiation L. Alianelli , K. J. S. Sawhney , R. Barrett , I. Pape , A. Malik , M. C. Wilson Optics Express DOI: 10.1364/OE.19.011120 PMID: 21716341 Show Abstract ▼ Abstract: Modern synchrotron sources have provided for decades intense beams of photons over a large energy spectrum. The availability of improved optics and detectors has opened up new opportunities for the study of matter at the micrometre and nanometre scale in many disciplines. Whilst exploitation of micro-focused beams occurs almost daily in many beamlines, the production of beams of 100 nm is achieved on few instruments which use specialised optics. Refractive lenses, zone plates, curved mirrors, multilayers, and multilayer Laue lenses, can all focus x-rays to less than 50 nm under strict beam stability conditions. Focusing the synchrotron radiation to beam sizes smaller than 10 nm is considered the ultimate goal for the current decade. Silicon micro-technology has so far provided some of the most advanced x-ray refractive lenses; we report on design and characterisation of a novel silicon kinoform lens that is capable of delivering nano-beams with high efficiency	May 2011
NONE-No attached Diamond beamline	Longitudinal coherence function in X-ray imaging of crystals S J Leake , M C Newton , R Harder , Ian Robinson Optics Express 17 (18), 15853-15859 DOI: 10.1364/OE.17.015853 PMID: 19724585 Show Abstract ▼ Abstract: The longitudinal coherence function at the Advanced Photon Source beamline 34-ID-C has been measured by a novel method and the coherence length (?L) determined to be, ?L = 0.66 ± 0.02µm. Three dimensional Coherent X-ray Diffraction (CXD) patterns were measured for multiple Bragg reflections from two Zinc Oxide (ZnO) nanorods with differing aspect ratios. The visibility of fringes corresponding to the 002 crystal direction for each reflection were found to be different and used to map the coherence function of the incident radiation. Partial coherence was found to be associated with amplitude ‘hot’ spots in three dimensional reconstructions of the crystal structure.	Aug 2009

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