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Instruments / Technical Area	Publication Details	Published	Actions
I22-Small angle scattering & Diffraction	Interfacial phenomena during salt layer formation under high rate dissolution conditions Josh Hammons , Alison Davenport , Seyed Ghahari , Mehdi Monir , Jean-Philippe Tinnes , Mahrez Amri , Nicholas Terrill , Federica Marone , Rajmund Mokso , Marco F. Stampanoni , Trevor Rayment The Journal Of Physical Chemistry B 117 (22) DOI: 10.1021/jp311666w Show Abstract ▼ Abstract: Interfacial phenomena occurring during high metal dissolution rates, in an environment with diffusion-limited transport of dissolution products, have been investigated using time-resolved X-ray diffraction (XRD), small-angle X-ray scattering (SAXS) and fast radiography. Time resolved SAXS data reveal that highly anisotropic interfacial X-ray scattering always precedes salt nucleation. The correlation between the interfacial scattering the presence of salt crystals indicates that the interface is between the metal electrode and the concentrated NiCl2 electrolyte and can therefore be interpreted as reflectivity or Porod scattering. Using fast radiography, we show that continued crystal nucleation and growth results in formation of a crystal-containing salt layer, which initially extends far from the interface (>20 μm), until the NiCl2 concentration decreases below saturation. Dissolution of this thick salt layer occurs mainly at the furthest boundary from the interface until, the salt layer thickness decreases to a steady state value, resulting in a steady state limiting current. These results show that the presence of a crystalline salt layer at a dissolving interface causes microscopic roughening which has implications for understanding both the role of salt films in pitting corrosion and electrochemical processing	Apr 2013
I13-1-Coherence	Hard X-ray stereographic microscopy for single-shot differential phase imaging Valerio Bellucci , Marie-Christine Zdora , Ladislav Mikes , Šarlota Birnšteinová , Peter Oberta , Marco Romagnoni , Andrea Mazzolari , Pablo Villanueva-Perez , Rajmund Mokso , Christian David , Mikako Makita , Silvia Cipiccia , Jozef Ulicny , Alke Meents , Adrian P. Mancuso , Henry N. Chapman , Patrik Vagovic Optics Express 31 DOI: 10.1364/OE.492137 Diamond Proposal Number(s): [17739] Open Access Show Abstract ▼ Abstract: The characterisation of fast phenomena at the microscopic scale is required for the understanding of catastrophic responses of materials to loads and shocks, the processing of materials by optical or mechanical means, the processes involved in many key technologies such as additive manufacturing and microfluidics, and the mixing of fuels in combustion. Such processes are usually stochastic in nature and occur within the opaque interior volumes of materials or samples, with complex dynamics that evolve in all three dimensions at speeds exceeding many meters per second. There is therefore a need for the ability to record three-dimensional X-ray movies of irreversible processes with resolutions of micrometers and frame rates of microseconds. Here we demonstrate a method to achieve this by recording a stereo phase-contrast image pair in a single exposure. The two images are combined computationally to reconstruct a 3D model of the object. The method is extendable to more than two simultaneous views. When combined with megahertz pulse trains of X-ray free-electron lasers (XFELs) it will be possible to create movies able to resolve 3D trajectories with velocities of kilometers per second.	May 2023

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