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Temperature dependence of the interface moments in Co2MnSi thin films

DOI: 10.1063/1.2927482 DOI Help

Authors: P. S. Keatley (University of Exeter) , E. Arenholz (Lawrence Berkeley National Laboratory) , Y. Sakuraba (Tohoku University) , M. Oogane (Tohoku University) , T. Miyazaki (Tohoku University) , R. J. Hicken (University of Exeter) , L. R. Shelford (University of Exeter) , N. D. Telling (Daresbury Laboratory) , G. Van Der Laan (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Letters , VOL 92 (19) , PAGES 192503

State: Published (Approved)
Published: May 2008

Abstract: X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co 2 MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements.L2 1 -ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn–Mn antiferromagnetic coupling. It is suggested that for ordered L2 1 CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.

Journal Keywords: Magnetic Films; Magnetic Tunnel Junctions; Annealing

Subject Areas: Physics


Instruments: NONE-No attached Diamond beamline