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Temperature dependence of the interface moments in Co2MnSi thin films
Authors:
P. S.
Keatley
(University of Exeter)
,
E.
Arenholz
(Lawrence Berkeley National Laboratory)
,
Y.
Sakuraba
(Tohoku University)
,
M.
Oogane
(Tohoku University)
,
T.
Miyazaki
(Tohoku University)
,
R. J.
Hicken
(University of Exeter)
,
L. R.
Shelford
(University of Exeter)
,
N. D.
Telling
(Daresbury Laboratory)
,
G.
Van Der Laan
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Applied Physics Letters
, VOL 92 (19)
, PAGES 192503
State:
Published (Approved)
Published:
May 2008
Abstract: X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co 2 MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements.L2 1 -ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn–Mn antiferromagnetic coupling. It is suggested that for ordered L2 1 CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.
Journal Keywords: Magnetic Films; Magnetic Tunnel Junctions; Annealing
Subject Areas:
Physics
Instruments:
NONE-No attached Diamond beamline