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Accurate and efficient data acquisition methods for high-resolution angle-resolved photoemission microscopy

DOI: 10.1038/s41598-018-34894-7 DOI Help

Authors: Hideaki Iwasawa (Hiroshima Synchrotron Radiation Center, Hiroshima University; Diamond Light Source) , Hitoshi Takita (Hiroshima University) , Kazuki Goto (Hiroshima University) , Wumiti Mansuer (Hiroshima University) , Takeo Miyashita (Hiroshima University) , Eike F. Schwier (Hiroshima Synchrotron Radiation Center, Hiroshima University) , Akihiro Ino (Hiroshima Synchrotron Radiation Center, Hiroshima University; Kurume Institute of Technology) , Kenya Shimada (Hiroshima Synchrotron Radiation Center, Hiroshima University) , Yoshihiro Aiura (National Institute of Advanced Industrial Science and Technology)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scientific Reports , VOL 8

State: Published (Approved)
Published: November 2018

Open Access Open Access

Abstract: Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental technique in materials science, as it can directly probe electronic states inside solids in energy (E) and momentum (k) space. As an advanced technique, spatially-resolved ARPES using a well-focused light source (high-resolution ARPES microscopy) has recently attracted growing interests because of its capability to obtain local electronic information at micro- or nano-metric length scales. However, there exist several technical challenges to guarantee high precision in determining translational and rotational positions in reasonable measurement time. Here we present two methods of obtaining k-space mapping and real-space imaging in high-resolution ARPES microscopy. One method is for k-space mapping measurements that enables us to keep a target position on a sample surface during sample rotation by compensating rotation-induced displacements (tracing acquisition method). Another method is for real-space imaging measurements that significantly reduces total acquisition time (scanning acquisition method). We provide several examples of these methods that clearly indicate higher accuracy in k-space mapping as well as higher efficiency in real-space imaging, and thus improved throughput of high-resolution APRES microscopy.

Journal Keywords: Electronic properties and materials

Subject Areas: Physics, Technique Development


Technical Areas:

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s41598-018-34894-7.pdf