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Redox behaviour of a ceria-zirconia inverse model catalyst

DOI: 10.1016/j.susc.2018.12.005 DOI Help

Authors: Michael Allan (University College London) , David Grinter (Diamond Light Source) , Simran Dhaliwal (University College London; Diamond Light Source) , Chris Muryn (University of Manchester) , Thomas Forrest (Diamond Light Source) , Francesco Maccherozzi (Diamond Light Source) , Sarnjeet S. Dhesi (Diamond Light Source) , Geoff Thornton (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Surface Science , VOL 682 , PAGES 8-13

State: Published (Approved)
Published: April 2019
Diamond Proposal Number(s): 17343

Abstract: The redox behaviour modification following the addition of zirconia to ceria nanostructures supported on Rh(111) has been investigated using a combination of Low Energy Electron Diffraction (LEED) and X-ray Photoemission Electron Microscopy (XPEEM). Soft X-ray irradiation was employed to reduce ZrO2-x(111) supported on Rh(111) and, by introducing oxygen, the reoxidation process of the thin film was monitored. CeO2(111) was then deposited on zirconia/Rh(111) and, using XPEEM, we determined that the mixed metal oxide formed a phase-separated structure with CeO2(111) nanoparticles on top of the zirconia. Upon exposure of CeO2-x/ZrO2-x/Rh(111) to X-ray illumination, the zirconia no longer undergoes any observable reduction while at the same time the ceria is reduced. Our results indicate a synergy between the zirconia and ceria in the phase-separated system expected in the working catalyst, with oxygen transfer between the metal oxides. This sheds light on the mechanism of the enhancement of catalytic properties seen with the addition of zirconia to ceria and highlights the oxygen storage and release ability of ceria.

Journal Keywords: Ceria-zirconia; Redox; X-ray photoelectron microscopy; Oxygen transfer

Subject Areas: Chemistry, Materials

Instruments: I06-Nanoscience

Added On: 12/12/2018 09:20

Discipline Tags:

Surfaces Physics Chemistry Materials Science interfaces and thin films Inorganic Chemistry Nanoscience/Nanotechnology

Technical Tags:

Microscopy Spectroscopy Electron Microscopy (EM) PhotoEmmission Electron Microscopy (PEEM) X-ray Absorption Spectroscopy (XAS) X-ray Photoelectron Spectroscopy (XPS) Near Edge X-ray Absorption Fine Structures (NEXAFS)