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Optical elements for dynamically broadening the focus of micro-focus optics at synchrotron x-ray sources

DOI: 10.1063/1.5084637 DOI Help

Authors: David Laundy (Diamond Light Source) , Kawal Sawhney (Diamond Light Source) , Vishal Dhamgaye (Raj Ramanna Centre for Advanced Technology) , Graham Duller (Diamond Light Source) , Gwyndaf Evans (Diamond Light Source) , Jose Trincao (Diamond Light Source) , Anna Warren (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Proceedings of the 13th International Conference on Synchrotron Radiation Instrumentation – SRI2018
Peer Reviewed: No

State: Published (Approved)
Published: January 2019

Open Access Open Access

Abstract: Third generation synchrotron radiation sources offer the possibility of using high demagnification ratio optics to achieve a micro-focused X-ray beam profile of size less than one micrometre size. This is highly advantageous for a variety of experiments. There is however also a requirement for the capability to dynamically broaden the micro-focused beam size during an experiment. As is described in this paper, this can be achieved using a specially profiled X-ray mirrors or by using custom designed refractive optics. These two approaches have the effect of introducing a controlled distortion onto the X-ray wavefront and when the wavefront propagates to the focal plane, the distortion determines the intensity profile of the X-ray beam.

Journal Keywords: Synchrotrons; Optical elements; Geometrical optics; X-ray mirrors

Subject Areas: Technique Development, Physics


Instruments: B16-Test Beamline

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