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Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool

DOI: 10.1063/1.5057712 DOI Help

Authors: T. Zhou (Diamond Light Source) , H. Wang (Diamond Light Source) , O. J. L. Fox (Diamond Light Source) , K. J. S. Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Review Of Scientific Instruments , VOL 90

State: Published (Approved)
Published: February 2019
Diamond Proposal Number(s): 16534

Open Access Open Access

Abstract: X-ray mirrors are widely used in beamlines and laboratories as focusing or collimating optics. As well as the highly accurate processes used to fabricate them, optimized alignment of X-ray mirrors also plays an important role in achieving an ideal X-ray beam. Currently, knife-edge scans are the most often used method for aligning X-ray mirrors, which can characterize the focal size and tune the alignment iteratively. However, knife-edge scanning provides only one-dimensional information and this method suffers from being time-consuming and requiring a high-resolution piezo translation stage. Here we describe a straightforward and non-iterative method for mirror alignment by measuring the relationship between the tilt aberration and the misaligned pitch angle, which is retrieved by an at-wavelength metrology technique using a randomly shaped wavefront modulator. Software and a graphical user interface have been developed to automate the alignment process. Combining the user-friendly interface and the flexibility of the at-wavelength metrology technique, we believe the proposed method and software can benefit researchers working at synchrotron facilities and on laboratory sources.

Journal Keywords: Metrology; Synchrotrons; Speckle imaging; Graphical user interface; Geometrical optics; X-ray mirrors; Data processing

Subject Areas: Technique Development


Instruments: B16-Test Beamline

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