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Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector

DOI: 10.1038/s41598-019-40413-z DOI Help

Authors: Jiamei Song (Nanjing University) , Christopher Allen (Diamond Light Source; University of Oxford) , Si Gao (Nanjing University) , Chen Huang (University of Oxford) , Hidetaka Sawada (JEOL Ltd) , Xiaoqing Pan (University of California) , Jamie Warner (University of Oxford) , Peng Wang (Nanjing University) , Angus I. Kirkland (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scientific Reports , VOL 9

State: Published (Approved)
Published: March 2019
Diamond Proposal Number(s): 17918

Open Access Open Access

Abstract: Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions.

Journal Keywords: Characterization and analytical techniques; Imaging techniques; Phase-contrast microscopy; Transmission electron microscopy; Two-dimensional materials

Subject Areas: Technique Development, Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Documents:
s41598-019-40413-z.pdf