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First results using the new DLS Xspress4 digital pulse processor with monolithic segmented HPGe detectors on XAS beamlines

DOI: 10.1063/1.5084696 DOI Help

Authors: G. Dennis (Diamond Light Source) , W. Helsby (Science and Technology Facilities Council (STFC)) , D. Omar (Diamond Light Source) , I. Horswell (Diamond Light Source) , N. Tartoni (Diamond Light Source) , S. Hayama (Diamond Light Source) , I. Mikulska (Diamond Light Source) , S. Diaz-moreno (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 13th International Conference on Synchrotron Radiation Instrumentation – SRI2018
Peer Reviewed: No

State: Published (Approved)
Published: January 2019

Open Access Open Access

Abstract: Diamond Light Source (DLS) I20-Scanning is a high flux X-ray Absorption Spectroscopy (XAS) beamline optimized for challenging samples, operating between 4keV and 20keV. The principal detector used for collecting XAS in fluorescence mode is a Canberra 64-pixel Monolithic Segmented Hyper Pure Germanium Detector (HPGe) historically partnered with the STFC Xspress2 Digital Pulse Processor (DPP). Prior signal analysis had shown that key parameters such as Energy Resolution and Peak-to-Background ratio are compromised by pixel-to-pixel crosstalk within the detector, especially at higher count rates (>250kcps per pixel). The DLS Detector Group have developed the new Xspress4 DPP to address such issues. This results in typically a factor 3-7 increase in detector system count rate for the same Energy Resolution and Peak-to-Background ratio compared to the previous state-of-the-art DPP. An overview of the complete detector system is given and recent results obtained during the commissioning on the beamline are shown. Further, comparative results from challenging experiments are also shown, demonstrating the improved performance attainable at the previous high count rate by partnering legacy HPGe Detectors with the latest DPP technology.

Journal Keywords: X-ray absorption spectroscopy; Signal processing; Semiconductor detectors

Subject Areas: Technique Development


Instruments: I20-Scanning-X-ray spectroscopy (XAS/XES)

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