X-ray ptychography on low-dimensional hard-condensed matter materials

DOI: 10.1063/1.5045131

Authors: Xiaowen Shi (Diamond Light Source) , Nicolas Burdet (Advanced Light Source) , Bo Chen (Tongji University; University College London) , Gang Xiong (University of Cambridge) , Robert Streubel (Lawrence Berkeley National Laboratory) , Ross Harder (Advanced Photon Source) , Ian K. Robinson (University College London; Brookhaven National Laboratory)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Reviews , VOL 6

State: Published (Approved)
Published: March 2019

Abstract: Tailoring structural, chemical, and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivities at the nano/atomic scale in two- and three-dimensional space. Soft X-ray radiation and hard X-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely, X-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss the current research examples of far-field diffraction-based X-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets and their blooming future as a mainstream tool for materials sciences.

Journal Keywords: Synchrotrons; Materials science; Ptychography; Semiconductors; Crystal lattices; Nanotechnology; X-ray diffraction; Magnetic materials

Subject Areas: Technique Development, Materials, Physics


Technical Areas:

Documents:
jhlp45l4.pdf