How best to use photons

DOI: 10.1107/S2059798319003528

Authors: Graeme Winter (Diamond Light Source) , Richard J. Gildea (Diamond Light Source) , Neil G. Paterson (Diamond Light Source) , John Beale (Diamond Light Source) , Markus Gerstel (Diamond Light Source) , Danny Axford (Diamond Light Source) , Melanie Vollmar (Diamond Light Source) , Katherine E. Mcauley (Diamond Light Source) , Robin L. Owen (Diamond Light Source) , Ralf Flaig (Diamond Light Source) , Alun W. Ashton (Diamond Light Source) , David Hall (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Acta Crystallographica Section D Structural Biology , VOL 75 , PAGES 242 - 261

State: Published (Approved)
Published: March 2019

Abstract: Strategies for collecting X-ray diffraction data have evolved alongside beamline hardware and detector developments. The traditional approaches for diffraction data collection have emphasised collecting data from noisy integrating detectors (i.e. film, image plates and CCD detectors). With fast pixel array detectors on stable beamlines, the limiting factor becomes the sample lifetime, and the question becomes one of how to expend the photons that your sample can diffract, i.e. as a smaller number of stronger measurements or a larger number of weaker data. This parameter space is explored via experiment and synthetic data treatment and advice is derived on how best to use the equipment on a modern beamline. Suggestions are also made on how to acquire data in a conservative manner if very little is known about the sample lifetime.

Journal Keywords: radiation damage; data collection; data processing; data analysis

Subject Areas: Technique Development, Biology and Bio-materials


Instruments: I03-Macromolecular Crystallography , I24-Microfocus Macromolecular Crystallography

Added On: 22/03/2019 14:26

Documents:
ba5301.pdf

Discipline Tags:

Technique Development - Life Sciences & Biotech Structural biology Life Sciences & Biotech

Technical Tags:

Diffraction Macromolecular Crystallography (MX)