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High-energy, high-resolution, fly-scan X-ray phase tomography
DOI:
10.1038/s41598-019-45561-w
Authors:
Hongchang
Wang
(Diamond Light Source)
,
Robert C.
Atwood
(Diamond Light Source)
,
Matthew James
Pankhurst
(Research Complex at Harwell; University of Leeds; Instituto Tecnológico y de Energías Renovables (ITER); Instituto Volcanológico de Canariaes (INVOLCAN))
,
Yogesh
Kashyap
(Bhabha Atomic Research Centre)
,
Biao
Cai
(University of Birmingham)
,
Tunhe
Zhou
(Diamond Light Source)
,
Peter David
Lee
(Research Complex at Harwell; University College London)
,
Michael
Drakopoulos
(Diamond Light Source)
,
Kawal
Sawhney
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Scientific Reports
, VOL 9
, PAGES 8913
State:
Published (Approved)
Published:
June 2019
Diamond Proposal Number(s):
14033

Abstract: High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120 keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.
Subject Areas:
Technique Development,
Physics
Technical Areas:
Optics
Documents:
s41598-019-45561-w.pdf