High-energy, high-resolution, fly-scan X-ray phase tomography

DOI: 10.1038/s41598-019-45561-w

Authors: Hongchang Wang (Diamond Light Source) , Robert C. Atwood (Diamond Light Source) , Matthew James Pankhurst (Research Complex at Harwell; University of Leeds; Instituto Tecnológico y de Energías Renovables (ITER); Instituto Volcanológico de Canariaes (INVOLCAN)) , Yogesh Kashyap (Bhabha Atomic Research Centre) , Biao Cai (University of Birmingham) , Tunhe Zhou (Diamond Light Source) , Peter David Lee (Research Complex at Harwell; University College London) , Michael Drakopoulos (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scientific Reports , VOL 9 , PAGES 8913

State: Published (Approved)
Published: June 2019
Diamond Proposal Number(s): 14033

Abstract: High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120 keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.

Subject Areas: Technique Development, Physics


Technical Areas: Optics

Documents:
s41598-019-45561-w.pdf