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Elastic coupling at epitaxial multiferroic interfaces: in situ x-ray studies of electric field induced strain

DOI: 10.1007/978-3-030-31866-6 DOI Help

Authors: C. T. Koops (Kiel University) , S. B. Hrkac (Kiel University) , M. Abes (Kiel University) , P. Jordt (Kiel University) , J. Stettner (Kiel University) , A. Petraru (Kiel University) , H. Kohlstedt (Kiel University) , V. Hrkac (Kiel University) , N. Wolff (Kiel University) , L. Kienle (Kiel University) , O. H. Seeck (DESY) , G. Nisbet (Diamond Light Source) , O. M. Magnussen (Kiel University) , B. M. Murphy (Kiel University)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: ICNBME 2019: 4th International Conference on Nanotechnologies and Biomedical Engineering
Peer Reviewed: No

State: Published (Approved)
Published: September 2019

Abstract: The elastic coupling in multiferroic materials and even more so in magnetoelectric composites plays an important role for the properties and function. In this study, the electrically induced strain at the epitaxial interface of 0.72Pb(Mn1/3Nb2/3)O3–0.28PbTiO3—CoFe2O4, a magnetoelectric composite, is characterized by in situ X-ray scattering experiment and transmission electron microscopy study. For the measured range all strain induced lattice changes are reversible ruling out plastic deformation. The surprisingly non-perfect elastic coupling of 87 ± 7% in this epitaxial system can be explained by the presence of planar defects in the CFO film.

Journal Keywords: Magnetoelectric composites; Strain coupling; XRD; TEM

Subject Areas: Materials, Physics

Instruments: I16-Materials and Magnetism

Other Facilities: DESY