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Room-temperature X-ray response of cadmium–zinc–telluride pixel detectors grown by the vertical Bridgman technique
DOI:
10.1107/S1600577519015996
Authors:
Leonardo
Abbene
(University of Palermo)
,
Fabio
Principato
(University of Palermo)
,
Gaetano
Gerardi
(University of Palermo)
,
Antonino
Buttacavoli
(University of Palermo)
,
Donato
Cascio
(University of Palermo)
,
Manuele
Bettelli
(IMEM-CNR)
,
Nicola
Sarzi Amade
(IMEM-CNR)
,
Paul
Seller
(Rutherford Appleton Laboratory)
,
Matthew C.
Veale
(Rutherford Appleton Laboratory)
,
Oliver
Fox
(Diamond Light Source)
,
Kawal
Sawhney
(Diamond Light Source)
,
Silvia
Zanettini
(due2lab s.r.l.)
,
Elio
Tomarchio
(University of Palermo)
,
Andrea
Zappettini
(IMEM-CNR)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Journal Of Synchrotron Radiation
, VOL 27
State:
Published (Approved)
Published:
March 2020
Diamond Proposal Number(s):
20545
Abstract: In this work, the spectroscopic performances of new cadmium–zinc–telluride (CZT) pixel detectors recently developed at IMEM-CNR of Parma (Italy) are presented. Sub-millimetre arrays with pixel pitch less than 500 µm, based on boron oxide encapsulated vertical Bridgman grown CZT crystals, were fabricated. Excellent room-temperature performance characterizes the detectors even at high-bias-voltage operation (9000 V cm−1), with energy resolutions (FWHM) of 4% (0.9 keV), 1.7% (1 keV) and 1.3% (1.6 keV) at 22.1, 59.5 and 122.1 keV, respectively. Charge-sharing investigations were performed with both uncollimated and collimated synchrotron X-ray beams with particular attention to the mitigation of the charge losses at the inter-pixel gap region. High-rate measurements demonstrated the absence of high-flux radiation-induced polarization phenomena up to 2 × 106 photons mm−2 s−1. These activities are in the framework of an international collaboration on the development of energy-resolved photon-counting systems for high-flux energy-resolved X-ray imaging.
Journal Keywords: X-ray and gamma-ray detectors; CdZnTe pixel detectors; charge sharing; charge losses; spectroscopic X-ray imaging; vertical Bridgman technique
Subject Areas:
Physics
Instruments:
B16-Test Beamline
Added On:
04/02/2020 10:35
Discipline Tags:
Detectors
Engineering & Technology
Technical Tags:
Imaging