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Phase reconstruction using fast binary 4D STEM data

DOI: 10.1063/1.5143213 DOI Help

Authors: C. M. O'Leary (University of Oxford) , C. S. Allen (University of Oxford; Diamond Light Source) , C. Huang (University of Oxford) , J. S. Kim (University of Oxford) , Emanuela Liberti (University of Oxford; Diamond Light Source) , P. D. Nellist (University of Oxford) , Angus Kirkland (University of Oxford; Diamond Light Source; The Rosalind Franklin Institute)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Letters , VOL 116

State: Published (Approved)
Published: March 2020
Diamond Proposal Number(s): 20431 , 22317

Abstract: We report the application of focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM). Modern fast pixelated detectors have enabled imaging of individual convergent beam electron diffraction patterns in a STEM raster scan at frame rates in the range of 1000–8000 Hz using conventional counting modes. Changing the bit depth of a counting detector, such that only values of 0 or 1 can be recorded at each pixel, allows one to decrease the dwell time and increase the frame rate to 12.5 kHz, reducing the electron exposure of the sample for a given beam current. Atomically resolved phase contrast of an aluminosilicate zeolite (ZSM-5) is observed from sparse diffraction patterns with isolated individual electrons, demonstrating the potential of binary ptychography as a low-dose 4D STEM technique.

Journal Keywords: Zeolites; Phase contrast microscopy; Ptychography; Transmission electron microscopy

Subject Areas: Technique Development, Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 01/04/2020 15:56

Discipline Tags:

Zeolites Technique Development - Materials Science Materials Science

Technical Tags:

Microscopy Electron Microscopy (EM) Scanning Transmission Electron Microscopy (STEM)