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Nanoscale magnetoelectric effects revealed by imaging

DOI: 10.1016/j.jmmm.2020.167016 DOI Help

Authors: M. Ghidini (University of Parma; Diamond Light Source; University of Cambridge) , S. S. Dhesi (Diamond Light Source) , N. D. Mathur (University of Cambridge)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Magnetism And Magnetic Materials

State: Published (Approved)
Published: May 2020
Diamond Proposal Number(s): 8876 , 6230

Abstract: We review our work on continuous Ni films coupled via strain to ferroelectric substrates of BaTiO3 (BTO) and 0.68Pb(Mg1/3Nb2/3)O3–0.32PbTiO3 (PMN-PT). We show that magnetic force microscopy (MFM) and photoemission electron microscopy (PEEM) of the Ni films (during or after electrical treatment) permit to reveal nanoscale converse magnetoelectric effects (CMEs) that are novel and elude macroscopic measurements. As examples, we discuss magnetization reversal without applied field in multilayer capacitors (MLCs), shear-strain-mediated CMEs in thin Ni films on PMN-PT and reversible switching of perpendicular magnetization from out-of-plane to in-plane in Ni films on BTO. In this latter case, we show that PEEM can be used to measure both magnetic and ferroelectric domains, thus providing key mechanistic insight in the magnetoelectric coupling mechanism.

Subject Areas: Materials, Physics


Instruments: I06-Nanoscience