Synchrotron X-ray scattering analysis of Nylon-12 crystallisation variation depending on 3D printing conditions

DOI: 10.3390/polym12051169

Authors: Benjamin De Jager (MBLEM, University of Oxford) , Thomas Moxham (MBLEM, University of Oxford) , Cyril Besnard (MBLEM, University of Oxford) , Enrico Salvati (MBLEM, University of Oxford; University of Udine) , Jingwei Chen (MBLEM, University of Oxford) , Igor P. Dolbnya (Diamond Light Source) , Alexander M. Korsunsky (MBLEM, University of Oxford; University of Udine)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Polymers , VOL 12

State: Published (Approved)
Published: May 2020
Diamond Proposal Number(s): 20428 , 24513

Abstract: Nylon-12 is an important structural polymer in wide use in the form of fibres and bulk structures. Fused filament fabrication (FFF) is an extrusion-based additive manufacturing (AM) method for rapid prototyping and final product manufacturing of thermoplastic polymer objects. The resultant microstructure of FFF-produced samples is strongly affected by the cooling rates and thermal gradients experienced across the part. The crystallisation behaviour during cooling and solidification influences the micro- and nano-structure, and deserves detailed investigation. A commercial Nylon-12 filament and FFF-produced Nylon-12 parts were studied by differential scanning calorimetry (DSC) and wide-angle X-ray scattering (WAXS) to examine the effect of cooling rates under non-isothermal crystallisation conditions on the microstructure and properties. Slower cooling rates caused more perfect crystallite formation, as well as alteration to the thermal properties.

Journal Keywords: fused filament fabrication; polyamide 12 (PA12); crystallisation; differential scanning calorimeter; X-ray diffraction

Diamond Keywords: Additive Manufacturing

Subject Areas: Chemistry, Materials


Instruments: B16-Test Beamline

Documents:
polymers-12-01169.pdf

Discipline Tags:

Chemistry Material Sciences Organic Chemistry Polymer Science

Technical Tags:

Scattering Wide Angle X-ray Scattering (WAXS)