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Hexagonal pad multichannel Ge X-ray spectroscopy detector demonstrator: comprehensive characterization

DOI: 10.1109/TNS.2020.3004923 DOI Help

Authors: N. Tartoni (Diamond Light Source) , S. Chatterji (Diamond Light Source) , R. Crook (Diamond Light Source) , T. Krings (Forschungszentrum J├╝lich) , L. Bombelli (XGLab Srl) , A. Alborini (XGLab Srl)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Ieee Transactions On Nuclear Science

State: Published (Approved)
Published: June 2020

Abstract: One of the major limitations of XAS experiment at synchrotron facilities is the performance of the detectors. In order to be able to measure more challenging samples and to cope with the very high photon flux of the current and future (diffraction limited) sources technological developments of detectors are necessary. This paper reports on the construction and characterization of a monolithic nineteen channel germanium detector demonstrator fitted with CMOS preamplifiers. The detector was characterized in the lab with radioactive sources and with the X-ray synchrotron beam. Characteristics such as energy resolution, linearity, counting rate capabilities, and stability of the detector were thoroughly evaluated. In addition, it was proved that by using an advanced pulse processor such as Xspress4 it was possible to improve the performance of the detector system by eliminating the cross talk among channels and by suppressing the charge shared events. This work could pave the way to enhanced germanium fluorescence detectors for high throughput X-ray spectroscopy.

Journal Keywords: Semiconductor radiation detectors; X-ray detectors; X-ray spectroscopy; charge sharing

Subject Areas: Engineering


Instruments: B16-Test Beamline

Added On: 13/07/2020 13:39

Discipline Tags:

Engineering & Technology Detectors

Technical Tags:

Imaging