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X-ray birefringence imaging (XBI): A new technique for spatially resolved mapping of molecular orientations in materials

DOI: 10.1007/978-981-15-5085-0_1 DOI Help

Authors: Kenneth D. M. Harris (Cardiff University) , Rhian Patterson (Cardiff University; Diamond Light Source) , Yating Zhou (Cardiff University) , Stephen P. Collins (Diamond Light Source)
Co-authored by industrial partner: No

Type: Book Chapter
ISBN: 978-981-15-5085-0
Book Chapter: 1

State: Published (Approved)
Published: July 2020

Abstract: The X-ray birefringence imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. In the case of organic materials, the technique may be applied to study the orientational properties of individual molecules and/or bonds, including the study of changes in molecular orientations associated with order–disorder phase transitions and characterization of phase transitions in liquid crystalline materials. This chapter presents a basic introduction to the XBI technique, giving a qualitative description of the fundamentals of the technique and discussing experimental aspects of the measurement of XBI data. Several examples are presented to highlight the application of the technique to study the orientational properties of molecules in organic materials.

Journal Keywords: X-ray birefringence imaging; Molecular orientations; Solid inclusion compounds; Liquid crystals; Anisotropic materials

Subject Areas: Technique Development, Materials

Instruments: B16-Test Beamline