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Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques

DOI: 10.1107/S1600577520007900 DOI Help

Authors: Frank Seiboth (Deutsches Elektronen-Synchrotron DESY) , Dennis Brückner (Deutsches Elektronen-Synchrotron DESY; Universität Hamburg; Ruhr-Universität Bochum) , Maik Kahnt (Deutsches Elektronen-Synchrotron DESY; Universität Hamburg) , Mikhail Lyubomirskiy (Deutsches Elektronen-Synchrotron DESY) , Felix Wittwer (Deutsches Elektronen-Synchrotron DESY; Universität Hamburg) , Dmitry Dzhigaev (Deutsches Elektronen-Synchrotron DESY) , Tobias Ullsperger (Friedrich-Schiller-Universität Jena) , Stefan Nolte (Friedrich-Schiller-Universität Jena; Fraunhofer Institute for Applied Optics and Precision Engineering) , Frieder Koch (Paul Scherrer Institute) , Christian David (Paul Scherrer Institute) , Jan Garrevoet (Deutsches Elektronen-Synchrotron DESY) , Gerald Falkenberg (Deutsches Elektronen-Synchrotron DESY) , Christian G. Schroer (Deutsches Elektronen-Synchrotron DESY; Universität Hamburg)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 27

State: Published (Approved)
Published: September 2020
Diamond Proposal Number(s): 19906

Open Access Open Access

Abstract: Modern subtractive and additive manufacturing techniques present new avenues for X-ray optics with complex shapes and patterns. Refractive phase plates acting as glasses for X-ray optics have been fabricated, and spherical aberration in refractive X-ray lenses made from beryllium has been successfully corrected. A diamond phase plate made by femtosecond laser ablation was found to improve the Strehl ratio of a lens stack with a numerical aperture (NA) of 0.88 × 10−3 at 8.2 keV from 0.1 to 0.7. A polymer phase plate made by additive printing achieved an increase in the Strehl ratio of a lens stack at 35 keV with NA of 0.18 × 10−3 from 0.15 to 0.89, demonstrating diffraction-limited nanofocusing at high X-ray energies.

Journal Keywords: refractive X-ray optics; aberration correction; ptychography; phase plate

Subject Areas: Technique Development

Instruments: I13-1-Coherence

Other Facilities: P06 at PETRA III