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Atomic resolution imaging of CrBr3 using adhesion-enhanced grids

DOI: 10.1021/acs.nanolett.0c02346 DOI Help

Authors: Matthew J. Hamer (University of Manchester) , David G. Hopkinson (University of Manchester) , Nick Clark (University of Manchester) , Mingwei Zhou (University of Manchester) , Wendong Wang (University of Manchester) , Yichao Zou (University of Manchester) , Daniel J. Kelly (University of Manchester) , Thomas H. Bointon (University of Manchester) , Sarah Haigh (University of Manchester) , Roman V. Gorbachev (University of Manchester; Henry Royce Institute)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nano Letters

State: Published (Approved)
Published: August 2020
Diamond Proposal Number(s): 19315 , 21597

Abstract: Suspended specimens of 2D crystals and their heterostructures are required for a range of studies including transmission electron microscopy (TEM), optical transmission experiments and nanomechanical testing. However, investigating the properties of laterally small 2D crystal specimens, including twisted bilayers and air sensitive materials, has been held back by the difficulty of fabricating the necessary clean suspended samples. Here we present a scalable solution which allows clean free-standing specimens to be realized with 100% yield by dry-stamping atomically thin 2D stacks onto a specially developed adhesion-enhanced support grid. Using this new capability, we demonstrate atomic resolution imaging of defect structures in atomically thin CrBr3, a novel magnetic material which degrades in ambient conditions.

Journal Keywords: Magnetic 2D Materials; TEM; Graphene Encapsulation; 2D Crystal Transfer; Suspended Devices

Diamond Keywords: Ferromagnetism; Antiferromagnetism

Subject Areas: Materials, Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 17/08/2020 11:34

Discipline Tags:

Materials Science Quantum Materials Physics Magnetism

Technical Tags:

Microscopy Electron Microscopy (EM) Transmission Electron Microscopy (TEM)