Directional fine structure in absorption of white x rays: A tomographic interpretation

DOI: 10.1103/PhysRevB.74.184116

Authors: P. Korecki (Jagiellonian University) , M. Tolkiehn (Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY; Advanced Photon Source) , D. Novikov (Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY) , G. Materlik (Diamond Light Source) , M. Szymonski (Jagiellonian University)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review B , VOL 74 (18)

State: Published (Approved)
Published: November 2006

Abstract: We discuss directional fine structure in absorption of white x rays for tomographic imaging of crystal structure at the atomic level. The interference between a direct x-ray beam and the secondary waves coherently scattered inside a specimen modifies the total wave field at the position of the absorbing atoms. For a white x-ray beam, the wave field variations cancel out by energy integration for all directions, except for the near forward scattering components, coinciding with the incident beam. Therefore, two-dimensional patterns of the angular-dependent fine structure in absorption of white x rays can be interpreted as real-space projections of atomic structure. In this work, we present a theory describing the directional fine structure in white x-ray absorption and a tomographic approach for crystal structure retrieval developed on its basis. The tomographic algorithm is applied to the experimental x-ray absorption data recorded for GaP crystals.

Journal Keywords: Absorption; Algorithms; Atoms; Crystal Structure; Crystals; Fine Structure; Gallium Phosphides; Interference; Scattering; Semiconductor Materials; Two-Dimensional Calculations; X Radiation

Subject Areas: Physics, Materials, Technique Development

Facility: HASYLAB/DESY

Added On: 10/11/2010 08:51

Discipline Tags:

Physics Technique Development - Physics Materials Science

Technical Tags: