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Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source
DOI:
10.1107/S1600577520009157
Authors:
Georg
Held
(Diamond Light Source; University of Reading)
,
Federica
Venturini
(Diamond Light Source)
,
David C.
Grinter
(Diamond Light Source)
,
Pilar
Ferrer
(Diamond Light Source)
,
Rosa
Arrigo
(Diamond Light Source; University of Salford)
,
Liam
Deacon
(Diamond Light Source)
,
Wilson
Quevedo Garzon
(Diamond Light Source; Helmholtz-Zentrum Berlin für Materialien und Energie)
,
Kanak
Roy
(Diamond Light Source)
,
Alex
Large
(University of Reading)
,
Christopher
Stephens
(Diamond Light Source)
,
Andrew
Watts
(Diamond Light Source)
,
Paul
Larkin
(Diamond Light Source)
,
Matthew
Hand
(Diamond Light Source)
,
Hongchang
Wang
(Diamond Light Source)
,
Linda
Pratt
(Diamond Light Source)
,
James J.
Mudd
(Diamond Light Source)
,
Thomas
Richardson
(Diamond Light Source)
,
Suren
Patel
(Diamond Light Source)
,
Michael
Hillman
(Diamond Light Source)
,
Stewart
Scott
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Journal Of Synchrotron Radiation
, VOL 27
State:
Published (Approved)
Published:
September 2020

Abstract: The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.
Journal Keywords: soft X-ray beamline; ambient-pressure XPS; X-ray absorption; catalysis; carbon contamination
Subject Areas:
Technique Development
Instruments:
B07-C-Versatile Soft X-ray beamline: Ambient Pressure XPS and NEXAFS
Added On:
24/08/2020 10:50
Documents:
ve5129.pdf
Discipline Tags:
Technical Tags:
Spectroscopy
X-ray Absorption Spectroscopy (XAS)
X-ray Photoelectron Spectroscopy (XPS)
Near Edge X-ray Absorption Fine Structures (NEXAFS)