Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

DOI: 10.1107/S1600577520009157

Authors: Georg Held (Diamond Light Source; University of Reading) , Federica Venturini (Diamond Light Source) , David C. Grinter (Diamond Light Source) , Pilar Ferrer (Diamond Light Source) , Rosa Arrigo (Diamond Light Source; University of Salford) , Liam Deacon (Diamond Light Source) , Wilson Quevedo Garzon (Diamond Light Source; Helmholtz-Zentrum Berlin für Materialien und Energie) , Kanak Roy (Diamond Light Source) , Alex Large (University of Reading) , Christopher Stephens (Diamond Light Source) , Andrew Watts (Diamond Light Source) , Paul Larkin (Diamond Light Source) , Matthew Hand (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Linda Pratt (Diamond Light Source) , James J. Mudd (Diamond Light Source) , Thomas Richardson (Diamond Light Source) , Suren Patel (Diamond Light Source) , Michael Hillman (Diamond Light Source) , Stewart Scott (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 27

State: Published (Approved)
Published: September 2020

Abstract: The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

Journal Keywords: soft X-ray beamline; ambient-pressure XPS; X-ray absorption; catalysis; carbon contamination

Subject Areas: Technique Development


Instruments: B07-C-Versatile Soft X-ray beamline: Ambient Pressure XPS and NEXAFS

Added On: 24/08/2020 10:50

Documents:
ve5129.pdf

Discipline Tags:



Technical Tags:

Spectroscopy X-ray Absorption Spectroscopy (XAS) X-ray Photoelectron Spectroscopy (XPS) Near Edge X-ray Absorption Fine Structures (NEXAFS)