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New method for estimating detector efficiency for charged particles with Diamond Light Source

DOI: 10.1016/j.nima.2020.164573 DOI Help

Authors: K. Metodiev (University of Oxford) , M. Mironova (University of Oxford) , D. Bortoletto (University of Oxford) , R. Plackett (University of Oxford) , P. Allport (University of Birmingham) , I. Asensi Tortajada (CERN (CH)) , R. Cardella (CERN (CH)) , F. Dachs (CERN (CH)) , V. Dao (CERN (CH)) , M. Dyndal (CERN (CH)) , L. Flores Sanz De Acedo (CERN (CH)) , P. Freeman (University of Birmingham) , A. Gabrielli (CERN (CH)) , L. Gonella (University of Birmingham) , M. Munker (CERN (CH)) , H. Pernegger (CERN (CH)) , F. Piro (CERN (CH)) , P. Riedler (CERN (CH)) , A. Sharma (University of Oxford; CERN (CH)) , E. J. Schioppa (CERN (CH)) , I. Shipsey (University of Oxford) , W. Snoeys (CERN (CH)) , C. Solans Sanchez (CERN (CH)) , H. Wennloef (University of Birmingham) , D. P. Weatherill (University of Oxford) , D. Wood (University of Oxford) , S. Worm (University of Birmingham)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment

State: Published (Approved)
Published: August 2020
Diamond Proposal Number(s): 2206

Abstract: Detector prototypes are commonly characterised in testbeams, either using charged particles or X-rays. Charged particles are used to quantify detector performance in terms of absolute efficiency, while X-rays can provide additional information about the detector structure. This paper presents an alternative approach to calculating charged particle efficiencies, using the results of an X-ray testbeam of the mini-MALTA CMOS prototype at Diamond Light Source, and additional laboratory measurements. Results are presented for an unirradiated and an irradiated sample and compared to the results of charged particle testbeams at SPS and ELSA. The extrapolated efficiencies are in agreement with the measured values. Additionally, the extrapolated efficiency maps provide more insight about the location of the pixel inefficiencies, due to the better spatial resolution of the X-ray testbeam.

Journal Keywords: Pixel detector; Silicon sensor; Synchrotron light source

Subject Areas: Technique Development, Physics


Instruments: B16-Test Beamline

Added On: 25/08/2020 09:42

Discipline Tags:

Engineering & Technology Detectors Physics Technique Development - Physics

Technical Tags: