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Depth-resolved magnetization dynamics revealed by X-ray reflectometry ferromagnetic resonance

DOI: 10.1103/PhysRevLett.125.137201 DOI Help

Authors: D. M. Burn (Diamond Light Source) , S. L. Zhang (ShanghaiTech University) , G. Q. Yu (Institute of Physics, Chinese Academy of Sciences) , Y. Guang (Institute of Physics, Chinese Academy of Sciences) , H. J. Chen (Tongji University) , X. P. Qiu (Tongji University) , Gerrit Van Der Laan (Diamond Light Source) , T. Hesjedal (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review Letters , VOL 125 , PAGES 137201

State: Published (Approved)
Published: September 2020
Diamond Proposal Number(s): 23895

Open Access Open Access

Abstract: Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks has remained elusive. By probing the ferromagnetic resonance modes with element-selective soft x-ray resonant reflectivity, we gain access to the magnetization dynamics as a function of depth. Most notably, using reflectometry ferromagnetic resonance, we find a phase lag between the coupled ferromagnetic layers in [CoFeB/MgO/Ta]4 multilayers that is invisible to other techniques. The use of reflectometry ferromagnetic resonance enables the time-resolved and depth-resolved probing of the complex magnetization dynamics of a wide range of functional magnetic heterostructures with absorption edges in the soft x-ray wavelength regime.

Journal Keywords: XMCD, spintronics, magnetic spectroscopy

Subject Areas: Physics, Materials, Engineering

Diamond Offline Facilities: Magnetic Spectroscopy Lab
Instruments: I10-Beamline for Advanced Dichroism


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