Measuring the border of the active area on silicon strip sensors

DOI: 10.1016/j.nima.2020.164665

Authors: S. Santpur (Lawrence Berkeley National Laboratory) , A. J. Blue (University of Glasgow) , C. Buttar (University of Glasgow) , V. Fadeyev (University of California Santa Cruz) , B. Gallop (Science and Technology Facilities Council) , C. Helling (University of California Santa Cruz) , C. Labitan (Lawrence Berkeley National Laboratory) , P. W. Phillips (Science and Technology Facilities Council) , L. Poley (Lawrence Berkeley National Laboratory) , C. Sawyer (Science and Technology Facilities Council) , M. Ullán (IMB-CNM (CSIC)) , Y. Unno (High Energy Accelerator Research Organization (KEK))
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment , VOL 985

State: Published (Approved)
Published: September 2020
Diamond Proposal Number(s): 18807 , 22002

Abstract: Silicon strip sensors for the ATLAS Inner Tracker (ITk) have been designed to provide reliable particle detection in the high-radiation environment of the High-Luminosity Large Hadron Collider. One important design criterion for their development is the minimization of inactive sensor areas, which affect the hermiticity of particle detection inside the detector. In previous measurements of ATLAS silicon strip sensors, the charge-collecting area of individual strip implants has been mapped and found to agree with the sensor strip pitch and strip length. For strip implants next to the sensor bias ring, the extent of their charge-collecting area towards the inactive sensor area was previously unknown, which limited the accuracy of both overall detector hermiticity estimates and the position resolution for particle detection at the sensor edge. Therefore, measurements were conducted to map the area of charge collection for sensor strips at the edge of the active sensor area using a micro-focused X-ray beam. This publication presents measurements showing the extent of charge collection in the edge strips of silicon strip sensors for two generations of ATLAS ITk strip sensor modules. The measurements confirmed that charge deposited in a strip implant that is neither connected nor grounded leads to capacitive coupling to the adjacent strip, where it is indistinguishable from a hit in that strip.

Journal Keywords: ATLAS; Silicon strip sensors; Sensor corner; Charge collection

Subject Areas: Physics


Instruments: B16-Test Beamline

Added On: 30/09/2020 11:42

Discipline Tags:

Detectors Physics Engineering & Technology

Technical Tags:

Diffraction