Publication

Article Metrics

Citations


Online attention

Non-destructive surface characterization of float glass: X-ray reflectivity and grazing incidence X-ray fluorescence analysis

DOI: 10.1016/j.jnoncrysol.2005.05.026 DOI Help

Authors: M. Tiwari (Diamond Light Source) , M. H. Modi (Synchrotron Utilization Division Centre for Advanced Technology, India) , G. S. Lodha (Synchrotron Utilization Division Centre for Advanced Technology, India) , A. K. Sinha (Synchrotron Utilization Division Centre for Advanced Technology, India) , K. J. S. Sawhney (Diamond Light Source) , R. V. Nandekar (Synchrotron Utilization Division Centre for Advanced Technology, India)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Non-crystalline Solids , VOL 351 , PAGES 2341 - 2347

State: Published (Approved)
Published: July 2005

Abstract: In the present study we have carried out non-destructive surface characterization of a float glass using total reflection X-ray fluorescence (TXRF) technique and X-ray reflectivity (XRR). The in-depth distribution of Sn and Fe impurities has been determined by TXRF where as X-ray optical properties such as r.m.s surface roughness, refractive index, etc., have been derived by XRR. The results obtained so are used in analyzing the soft X-ray optical constants in the wavelength region of 80–200 Å. The results obtained indicate that two surfaces of float glass differ significantly.

Subject Areas: Technique Development


Technical Areas: