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Investigation of the stripe patterns from X-ray reflection optics

DOI: 10.1364/OE.417030 DOI Help

Authors: Lingfei Hu (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , John P. Sutter (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 29

State: Published (Approved)
Published: January 2021
Diamond Proposal Number(s): 26501

Open Access Open Access

Abstract: X-ray beams reflected from a single layer or multilayer coating are widely used for X-ray tomography, holography, and X-ray phase contrast imaging. However, the observed irregular stripe patterns from either unfocused or defocused beams often cause disturbing artifacts and seriously deteriorate the image quality. In this work, we investigate the origin of these irregular fine structures using the wave optics theory. The connection to similar results obtained by the geometric optics theory is also presented. The proposed relation between the second derivative of the wavefront and the irregular structures was then verified by conducting at-wavelength metrology with the speckle-based wavefront sensing technique. This work will not only help to understand the formation of these irregular structures but also provide the basis for manufacturing future ‘stripe-free’ refection optics.

Subject Areas: Physics


Instruments: B16-Test Beamline

Added On: 01/02/2021 13:43

Documents:
oe-29-3-4270.pdf

Discipline Tags:

Physics Optics

Technical Tags:

Diffraction X-ray Reflectivity (XRR)