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Solidification microstructure and residual stress correlations in direct energy deposited type 316L stainless steel
DOI:
10.1016/j.matdes.2021.109782
Authors:
Da
Guo
(The University of Manchester)
,
Kun
Yan
(The University of Manchester)
,
Mark D.
Callaghan
(High Temperature Materials, Jacobs)
,
Dominik
Daisenberger
(Diamond Light Source)
,
Mark
Chatterton
(Corrosion and Materials Science, Jacobs)
,
Jiadong
Chen
(The University of Manchester)
,
Andrew
Wisbey
(High Temperature Materials, Jacobs)
,
Wajira
Mirihanage
(The University of Manchester)
Co-authored by industrial partner:
Yes
Type:
Journal Paper
Journal:
Materials & Design
State:
Published (Approved)
Published:
May 2021
Diamond Proposal Number(s):
20605
Abstract: Localized fluctuation in residual stress distribution for direct energy deposited 316L stainless steel thin plate was revealed through high-energy synchrotron X-ray diffraction. The macroscopic residual stress levels are changed steadily across the article according to the characteristic cooling rates, as implied by the measured dendrite arm lengths. Localized fluctuations of residual stress in the length scale, between 500 to 600 µm, coincides well with the morphological variations of the solidification microstructure that formed during direct energy deposition. Computations indicate a greater propensity for related mesoscopic thermal gradient fluctuations along the solidification front of the moving melt pool. Novel perspectives on residual stress across multiple length-scales and its relevance to the formation of solidification microstructure in metal additive manufacturing is analysed by considering the experimental results.
Journal Keywords: Metal additive manufacturing; X-ray diffraction; 316L
Diamond Keywords: Additive Manufacturing; Alloys
Subject Areas:
Materials,
Engineering
Instruments:
I15-Extreme Conditions
Added On:
05/05/2021 09:18
Documents:
1-s2.0-S026412752100335X-main.pdf
Discipline Tags:
Materials Engineering & Processes
Materials Science
Engineering & Technology
Metallurgy
Technical Tags:
Diffraction