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Shear-induced chemical segregation in a Fe-based bulk metallic glass at room temperature

DOI: 10.1038/s41598-021-92907-4 DOI Help

Authors: D. V. Louzguine-Luzgin (Tohoku University; National Institute of Advanced Industrial Science and Technology (AIST)) , A. S. Trifonov (National University of Science and Technology “MISiS”; Lomonosov Moscow State University) , Y. P. Ivanov (University of Cambridge; Far Eastern Federal University) , A. K. A. Lu (National Institute of Advanced Industrial Science and Technology (AIST)) , A. V. Lubenchenko (National Research University “Moscow Power Engineering Institute”) , A. L. Greer (Tohoku University; University of Cambridge)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scientific Reports , VOL 11

State: Published (Approved)
Published: July 2021
Diamond Proposal Number(s): 24245

Open Access Open Access

Abstract: Shear-induced segregation, by particle size, is known in the flow of colloids and granular media, but is unexpected at the atomic level in the deformation of solid materials, especially at room temperature. In nanoscale wear tests of an Fe-based bulk metallic glass at room temperature, without significant surface heating, we find that intense shear localization under a scanned indenter tip can induce strong segregation of a dilute large-atom solute (Y) to planar regions that then crystallize as a Y-rich solid solution. There is stiffening of the material, and the underlying chemical and structural effects are characterized by transmission electron microscopy. The key influence of the soft Fe–Y interatomic interaction is investigated by ab-initio calculation. The driving force for the induced segregation, and its mechanisms, are considered by comparison with effects in other sheared media.

Subject Areas: Materials, Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 05/07/2021 11:42


Discipline Tags:

Physics Soft condensed matter physics Materials Science

Technical Tags:

Microscopy Electron Microscopy (EM) Transmission Electron Microscopy (TEM)