Design of electron ptychography experiments through simulations

Authors: Mohsen Danaie (Diamond Light Source) , Darren Batey (Diamond Light Source) , Thomas Slater (Diamond Light Source) , Christopher Allen (Diamond Light Source; University of Oxford)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: EMAG 2021
Peer Reviewed: No

State: Published (Approved)
Published: July 2021

Abstract: With the wider accessibility of fast direct-electron detectors, collecting electron diffraction patterns in the scanning mode of the transmission electron microscope is becoming common place. These datasets – also known as 4D-STEM, with two dimensions on the scan array and two on the detector plane containing the diffraction corresponding to a given probe position – can be used to reconstruct both the complex object and the probe using ptychographic algorithms. Solving for the object via ptychography, in principle, can relax the requirements on the optical hardware to achieve atomic resolution imaging and has also been shown to be beneficial in reducing the total dose received by the sample. Given the large number of parameters that the experimentalist operating a modern electron microscope can vary, carrying out an electron ptychography experiment, while ensuring that the collected data is conducive to a satisfactory reconstruction, can at times be a daunting task. Here we present a workflow to simulate a matrix of optical and sampling conditions to provide feedback on the optimal conditions to be used for the electron ptychography experiment. As there are various ptychographic reconstruction algorithms with different sampling criteria, our focus here is the extended ptychographical iterative engine (ePIE) implemented by one of the present authors in the ptyREX python library.

Journal Keywords: ptychography; simulation

Subject Areas: Information and Communication Technology

Technical Areas: Data acquisition

Added On: 12/08/2021 08:59

Discipline Tags:

Information & Communication Technologies Data processing

Technical Tags: