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Improved spatial resolution in X-ray microscopy using a tilted angle detector

DOI: 10.1109/NSS/MIC42677.2020.9507906 DOI Help

Authors: Polad Shikhaliev (Diamond Light Source) , Oliver Fox (Diamond Light Source) , Nicola Tartoni (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Peer Reviewed: No

State: Published (Approved)
Published: August 2021

Abstract: We performed simulations and experimental tests of a new method for improving the spatial resolution of x-ray imaging detectors using tilted angle irradiation. In this method, the x-ray beam arrives at the detector surface at an angle of <90° so that the beam footprint is expanded and the spatial resolution is increased. The proposed method is applicable for imaging with x-rays in the energy range of E = 0.2-15 keV, which is widely used for x-ray microscopy. The tilted angle irradiation technique can be applied to different types of x-ray microscopy detectors, including indirect conversion detectors (which consist of a scintillator optically coupled to the imaging camera), direct conversion detectors (such as CCD- and CMOS-based soft x-ray cameras) and some other semiconductor detectors. The experimental study described here employed an indirect detector configuration where a thin scintillator was optically coupled to an imaging camera via microscope optics. The spatial resolution was improved by a factor of 2.5 by using a tilt angle of 12° for 13.5 keV x-rays. This study will be continued using different xray energies and detector configurations.

Journal Keywords: Optical microscopy; Scintillators; Microscopy; Detectors; Optical detectors; Cameras; Optical imaging

Subject Areas: Physics

Instruments: B16-Test Beamline

Added On: 19/08/2021 09:02

Discipline Tags:

Engineering & Technology Detectors Physics Optics

Technical Tags: