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Dependence of exchange bias on structure of antiferromagnet in Fe/IrMn3

DOI: 10.1016/j.jmmm.2021.168678 DOI Help

Authors: R. Fan (Diamond Light Source) , R O. M. Aboljadayel (Diamond Light Source) , A. N. Dobrynin (Diamond Light Source) , P. Bencok (Diamond Light Source) , R. C. C. Ward (University of Oxford) , P. Steadman (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Magnetism And Magnetic Materials , VOL 105

State: Published (Approved)
Published: November 2021

Open Access Open Access

Abstract: Single-crystal exchange biased multilayer thin-films consisting of an Fe layer on single-crystal chemically ordered L12-IrMn3 and disordered γ-IrMn3 were investigated using circularly and linearly polarised soft X-ray reflectivity to de- termine the interfacial magnetic structure between Fe and IrMn3. In ordered L12-IrMn3, we found that the Mn uncompensated moments at the interface are strongly pinned and only Fe rotational moments are observed. In disor- dered γ-IrMn3 the uncompensated moments are partially pinned, where the Mn moments are rotatable but the rotations are restricted. These findings are a crucial development in exchange bias theory to understand the force that drives the magnetic reversal process in ordered and disordered IrMn3.

Journal Keywords: Exchange bias; Thin films; Magnetism; Magnetic; Antiferromagnetic; Ferromagnetic

Diamond Keywords: Antiferromagnetism; Ferromagnetism; Data Storage

Subject Areas: Materials, Physics, Information and Communication Technology


Instruments: I10-Beamline for Advanced Dichroism

Added On: 17/11/2021 09:46

Documents:
1-s2.0-S0304885321009148-main-2.pdf

Discipline Tags:

Information & Communication Technologies Components & Micro-systems Materials Science Quantum Materials Physics Electronics Magnetism Surfaces interfaces and thin films

Technical Tags:

Scattering Soft X-ray Resonant Magnetic Reflectivity (SXRMR)