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Thickness-dependent energy-level alignment at the organic–organic interface induced by templated gap states
Authors:
Jan
Hagenlocher
(University of Tübingen)
,
Katharina
Broch
(University of Tübingen)
,
Matthias
Zwadlo
(University of Tübingen)
,
Daniel
Lepple
(University of Tübingen)
,
Jonathan
Rawle
(Diamond Light Source)
,
Francesco
Carla
(Diamond Light Source)
,
Satoshi
Kera
(Institute for Molecular Science)
,
Frank
Schreiber
(University of Tübingen)
,
Alexander
Hinderhofer
(University of Tübingen)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Advanced Materials Interfaces
, VOL 133
State:
Published (Approved)
Published:
December 2021
Diamond Proposal Number(s):
18570

Abstract: Planar organic heterostructures are widely explored and employed in photovoltaic cells, light-emitting diodes, and bilayer field-effect transistors. An important role for device performance plays the energy level alignment at the inorganic–organic and organic–organic interfaces. In this work, incremental ultraviolet photoelectron spectroscopy measurements and real-time X-ray scattering experiments are used to thoroughly investigate the thickness-dependent electronic and structural properties of a perfluoropentacene (PFP)-on-[6]phenacene heterostructure. For both materials an incremental increase of the material work function (positive interface dipole) is found. For [6]phenacene, this can be assigned to a thickness-dependent change of molecular arrangement evident from a change of the unit cell volume and a consequential alteration of the ionization energy. In the case of PFP the interface dipole stems from charge transfer from the substrate into unoccupied molecular orbitals resulting in an electrostatic potential on the surface. The magnitude of this potential can be correlated with an increased gap state density resulting from templated structural defects mediated by the bottom layer.
Journal Keywords: energy-level alignment; gap states; organic semiconductors; structural defects
Diamond Keywords: Semiconductors
Subject Areas:
Materials,
Physics
Instruments:
I07-Surface & interface diffraction
Added On:
27/12/2021 10:24
Discipline Tags:
Surfaces
Hard condensed matter - electronic properties
Physics
Hard condensed matter - structures
Electronics
Materials Science
interfaces and thin films
Technical Tags:
Diffraction
Grazing Incidence X-ray Diffraction (GIXD)