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Structure of strained low‐dimensional Sb by in situ surface X‐ray diffraction

DOI: 10.1002/pssb.202100432 DOI Help

Authors: Philip J. Mousley (Diamond Light Source) , Christopher W. Burrows (Diamond Light Source) , Chris Nicklin (Diamond Light Source) , Gavin R. Bell (University of Warwick)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physica Status Solidi (b)

State: Published (Approved)
Published: January 2022
Diamond Proposal Number(s): 13769

Open Access Open Access

Abstract: Antimony ultra-thin films in tensile strain are grown on InAs(111)B substrates and studied in situ using surface X-ray diffraction. The detailed atomic structures of two highly crystalline Sb(0001) films are derived, with thicknesses of 19 and 4 bilayers. Features considered in structural modelling include interfacial intermixing, surface roughness, individual layer relaxations and rotational twin domains (RTDs). The 4-bilayer film shows significant structural relaxation in every layer, while both films include RTDs. The results are discussed in relation to the topological properties of low-dimensional Sb.

Journal Keywords: antimony; topological materials; 2D materials; strain; crystallography; surface X-ray diffraction

Subject Areas: Materials, Physics

Instruments: I07-Surface & interface diffraction

Added On: 13/01/2022 09:36

Physica Status Solidi b - 2022 - Mousley - Structure of strained low%E2%80%90dimensional Sb by in situ surface X%E2%80%90ray diffraction.pdf

Discipline Tags:

Surfaces Quantum Materials Physics Materials Science interfaces and thin films

Technical Tags: