Article Metrics


Online attention

Defect-driven antiferromagnetic domain walls in CuMnAs films

DOI: 10.1038/s41467-022-28311-x DOI Help

Authors: Sonka Reimers (University of Nottingham; Diamond Light Source) , Dominik Kriegner (Technische Universität Dresden; Institute of Physics, Czech Academy of Sciences) , Olena Gomonay (Johannes Gutenberg Universität Mainz) , Dina Carbone (MAX IV Laboratory) , Filip Krizek (Institute of Physics, Czech Academy of Sciences) , Vit Novák (Institute of Physics, Czech Academy of Sciences) , Richard P. Campion (University of Nottingham) , Francesco Maccherozzi (Diamond Light Source) , Alexander Bjorling (MAX IV Laboratory) , Oliver J. Amin (University of Nottingham) , Luke X. Barton (University of Nottingham) , Stuart F. Poole (University of Nottingham) , Khalid A. Omari (University of Nottingham) , Jan Michalička (Brno University of Technology) , Ondřej Man (Brno University of Technology) , Jairo Sinova (Johannes Gutenberg Universität Mainz) , Tomáš Jungwirth (University of Nottingham; Institute of Physics, Czech Academy of Sciences) , Peter Wadley (University of Nottingham) , Sarnjeet S. Dhesi (Diamond Light Source) , Kevin W. Edmonds (University of Nottingham)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nature Communications , VOL 13

State: Published (Approved)
Published: February 2022
Diamond Proposal Number(s): 22437 , 2714

Open Access Open Access

Abstract: Efficient manipulation of antiferromagnetic (AF) domains and domain walls has opened up new avenues of research towards ultrafast, high-density spintronic devices. AF domain structures are known to be sensitive to magnetoelastic effects, but the microscopic interplay of crystalline defects, strain and magnetic ordering remains largely unknown. Here, we reveal, using photoemission electron microscopy combined with scanning X-ray diffraction imaging and micromagnetic simulations, that the AF domain structure in CuMnAs thin films is dominated by nanoscale structural twin defects. We demonstrate that microtwin defects, which develop across the entire thickness of the film and terminate on the surface as characteristic lines, determine the location and orientation of 180∘ and 90∘ domain walls. The results emphasize the crucial role of nanoscale crystalline defects in determining the AF domains and domain walls, and provide a route to optimizing device performance.

Journal Keywords: Electronic and spintronic devices; Imaging techniques; Magnetic properties and materials; Surfaces, interfaces and thin films

Diamond Keywords: Data Storage; Antiferromagnetism; Spintronics

Subject Areas: Materials, Physics, Information and Communication Technology

Instruments: I06-Nanoscience

Other Facilities: NanoMAX at MAX IV

Added On: 14/02/2022 13:32


Discipline Tags:

Surfaces Quantum Materials Physics Electronics Components & Micro-systems Information & Communication Technologies Materials Science interfaces and thin films

Technical Tags:

Microscopy Electron Microscopy (EM) PhotoEmmission Electron Microscopy (PEEM)