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Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography

DOI: 10.1016/j.scriptamat.2011.01.024 DOI Help

Authors: Brian Abbey (University of Oxford) , Felix Hofmann (University of Oxford) , Jonathan Belnoue (University of Oxford) , Alexander Rack (European Synchrotron Radiation Facility) , Remi Tucoulouc (European Synchrotron Radiation Facility) , Gareth Hughes (University of Oxford) , Sophie Eve (CRISMAT ENSICAEN) , Alexander Korsunsky (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scripta Materialia

State: Published (Approved)
Published: January 2011

Abstract: When subjected to plastic deformation, grains within ductile face-centred cubic polycrystals fragment into “soft”, low dislocation density cells separated by “hard”, dislocation-rich walls. Using a narrow-bandwidth, sub-micrometre X-ray beam, we have mapped the deformation structure inside a single grain within a deformed Ni polycrystal. Dislocation multiplication and entanglement was found to vary depending on the physical dimensions of the grain. The method we use overcomes current limitations in classical X-ray topography allowing topographic images to be formed from small, highly deformed grains.

Journal Keywords: X-Ray Diffraction (Xrd); Synchrotron Radiation; Dislocation-Structure; Thin Films; Tension Test

Subject Areas: Engineering

Instruments: B16-Test Beamline