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X-ray investigation of long-range antiferromagnetic ordering in FeRh

DOI: 10.1063/9.0000320 DOI Help

Authors: Michael Grimes (The University of Manchester; Paul Scherrer Institute; ETH Zurich) , N. Gurung (Paul Scherrer Institute; ETH Zurich) , H. Ueda (Paul Scherrer Institute) , D. G. Porter (Diamond Light Source) , B. Pedrini (Paul Scherrer Institute) , L. J. Heyderman (Paul Scherrer Institute; ETH Zurich) , T. Thomson (The University of Manchester) , V. Scagnoli (Paul Scherrer Institute; ETH Zurich)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Aip Advances , VOL 12

State: Published (Approved)
Published: March 2022
Diamond Proposal Number(s): 21966

Open Access Open Access

Abstract: We demonstrate a probe of long-range antiferromagnetic (AF) order in FeRh thin films using non-resonant magnetic x-ray scattering. In particular, x-rays at energies below the Fe K-edge have been used for the observation of magnetic Bragg peaks. Due to the low efficiency of the magnetic scattering, a grazing incidence geometry was used to optimise the diffracted intensity from the thin film samples. Based on Scherrer analysis, we estimate a coherence length similar to previous reports from x-ray magnetic linear dichroism (XMLD) experiments, indicating that domain sizes are limited to 40 nm which is consistent with the grain size. The temperature dependent behaviour of the AF order shows an inverse correlation with the emergence of the ferromagnetic (FM) moment, as expected from the phase diagram.

Journal Keywords: Thin films; Incidence geometry; Bragg peak; Magnetic materials; X-ray diffraction; Phase transitions; Crystallographic defects

Diamond Keywords: Antiferromagnetism

Subject Areas: Materials, Physics

Instruments: I16-Materials and Magnetism

Other Facilities: MS at Swiss Light Source

Added On: 25/03/2022 23:01


Discipline Tags:

Surfaces Quantum Materials Physics Magnetism Materials Science interfaces and thin films

Technical Tags: