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Epitaxial SrTiO3 films with dielectric constants exceeding 25,000

DOI: 10.1073/pnas.2202189119 DOI Help

Authors: Zhifei Yang (University of Minnesota) , Dooyong Lee (University of Minnesota) , Jin Yue (University of Minnesota) , Judith Gabel (Diamond Light Source) , Tien-Lin Lee (Diamond Light Source) , Richard D. James (University of Minnesota) , Scott A. Chambers (Pacific Northwest National Laboratory) , Bharat Jalan (University of Minnesota)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Proceedings Of The National Academy Of Sciences , VOL 119

State: Published (Approved)
Published: June 2022
Diamond Proposal Number(s): 28680

Open Access Open Access

Abstract: SrTiO3 (STO) is an incipient ferroelectric perovskite oxide for which the onset of ferroelectric order is suppressed by quantum fluctuations. This property results in a very large increase in static dielectric constant from ∼300 at room temperature to ∼20,000 at liquid He temperature in bulk single crystals. However, the low-temperature dielectric constant of epitaxial STO films is typically a few hundred to a few thousand. Here, we use all-epitaxial capacitors of the form n-STO/undoped STO/n-STO (001) prepared by hybrid molecular beam epitaxy, to demonstrate intrinsic dielectric constants of an unstrained STO (001) film exceeding 25,000. We show that the n-STO/undoped STO interface plays a critically important role not previously considered in determining the dielectric properties that must be properly accounted for to determine the intrinsic dielectric constant.

Journal Keywords: SrTiO3 film; dielectric constant; ferroelectricity; antiferrodistortive transition

Diamond Keywords: Ferroelectricity; Semiconductors

Subject Areas: Materials, Physics

Instruments: I09-Surface and Interface Structural Analysis

Added On: 06/06/2022 11:46


Discipline Tags:

Surfaces Quantum Materials Hard condensed matter - electronic properties Physics Materials Science interfaces and thin films Perovskites Metallurgy

Technical Tags:

Spectroscopy X-ray Photoelectron Spectroscopy (XPS) Hard X-ray Photoelectron Spectroscopy (HAXPES)