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Probing electronic dead layers in homoepitaxial n-SrTiO3(001) films

DOI: 10.1063/5.0098500 DOI Help

Authors: S. A. Chambers (Pacific Northwest National Laboratory) , D. Lee (University of Minnesota) , Z. Yang (University of Minnesota) , Y. Huang (University of Minnesota) , W. Samarakoon (Pacific Northwest National Laboratory; Oregon State University) , H. Zhou (Advanced Photon Source) , P. V. Sushko (Pacific Northwest National Laboratory) , T. K. Truttmann (University of Minnesota) , L. W. Wangoh (Pacific Northwest National Laboratory; International Business Machines Research-Albany Nanotech Complex,) , T.-L. Lee (Diamond Light Source) , J. Gabel (Diamond Light Source) , B. Jalan (University of Minnesota)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Apl Materials , VOL 10

State: Published (Approved)
Published: July 2022

Open Access Open Access

Abstract: We combine state-of-the-art oxide epitaxial growth by hybrid molecular beam epitaxy with transport, x-ray photoemission, and surface diffraction, along with classical and first-principles quantum mechanical modeling to investigate the nuances of insulating layer formation in otherwise high-mobility homoepitaxial n-SrTiO3(001) films. Our analysis points to charge immobilization at the buried n-SrTiO3/undoped SrTiO3(001) interface as well as within the surface contamination layer resulting from air exposure as the drivers of electronic dead-layer formation. As Fermi level equilibration occurs at the surface and the buried interface, charge trapping reduces the sheet carrier density (n2D) and renders the n-STO film insulating if n2D falls below the critical value for the metal-to-insulator transition.

Journal Keywords: Thin films; Quantum mechanical models; Electronic transport; Electrostatics; X-ray photoelectron spectroscopy; X-ray diffraction; Epitaxy; X-ray crystal truncation rod scattering; Electronic band structure

Subject Areas: Materials, Physics

Technical Areas:

Added On: 25/07/2022 08:43


Discipline Tags:

Surfaces Quantum Materials Physics Materials Science interfaces and thin films

Technical Tags: