Rietveld Analysis of energy-dispersive diffraction data

Authors: Matthew Rowles (CSIRO) , Nicola Scarlett (CSIRO Process Science and Engineering) , Ian Madsen (CSIRO Process Science and Engineering) , John Evans (Department of Chemistry, Durham University) , Alan Coelho (Coelho Software)
Co-authored by industrial partner: No

Type: Poster

State: Published (Approved)
Published: February 2011
Diamond Proposal Number(s): 3171

Abstract: Energy-dispersive diffraction is an ideal technique for the collection of in situ diffraction data, as the technique allows for highly penetrating x-rays and the ability to isolate a diffraction volume in the interior of a sample or reaction vessel. The use of the method is hampered by the lack of analysis techniques capable of carrying out structural analyses of the collected data. This poster presents a method developed for the quantitative phase analysis of energy- dispersive data using crystal-structure-based Rietveld refinement. It has been tested with standard materials and found to be comparable in accuracy to results obtained from traditional angular-dispersive diffraction.

Journal Keywords: Rietveld; Modelling

Subject Areas: Technique Development, Materials

Instruments: I12-JEEP: Joint Engineering, Environmental and Processing

Added On: 08/03/2011 05:26

Discipline Tags:

Technique Development - Materials Science Materials Science

Technical Tags:

Diffraction Energy Dispersive Diffraction (EDD)